Systems and methods for managing storage endurance

ABSTRACT

Storage divisions of a non-volatile storage medium may have a writable state and an unwritable state. Storage divisions may be reclaimed by, inter alia, resetting the storage division from an unwritable state to a writable state. Writable storage divisions may be used to service incoming storage requests. If no writable storage divisions are available, requests may stall. One or more storage divisions may be held in a writable state to avoid stall conditions. This, however, may increase the erase dwell time of the storage divisions, which can result in increased wear and reduce the usable life of the storage device. Storage divisions may be prepared for use such that the storage divisions are transitioned to a writable state such that erase dwell time of the storage divisions is reduced, and the storage divisions are available as needed to service incoming requests.

CROSS-REFERENCE TO RELATED APPLICATIONS

This application claims priority to U.S. patent application Ser. No.14/661,971, filed Mar. 18, 2015, published as US 2016/0188221 on Jun.30, 2016 and issued as U.S. Pat. No. 9,766,819 on Sep. 19, 2017, whichclaims priority to U.S. Provisional Patent Application No. 62/098,321,filed Dec. 30, 2014, each of which are incorporated by reference.

TECHNICAL FIELD

This disclosure relates to storage systems and methods for managingsolid-state storage media and, in particular, to systems and methods formanaging erase dwell.

BACKGROUND

A storage medium may comprise storage locations that are reinitializedeach time new data is written thereto. As used herein, reinitializing astorage location refers to transitioning the storage location from anunwritable state to a writable state. In some embodiments, the writablestate of a storage location comprises an erased state, and theunwritable state of the storage location comprises a non-erased state.Accordingly, reinitializing a storage location may comprise erasing thestorage location. Erase operations may require more time to completethan other storage operations (e.g., 10 to 100 times longer than writeand/or read operations). Accordingly, a storage controller may maintaina pool of erased storage locations so that storage requests do not stallwhile the storage locations needed to service the requests are erased.

Storage locations may have a limited useful life, which may bequantified in terms of the number of program and/or erase operations thestorage locations can endure before failure. The useful life of astorage location may be further reduced by erase dwell. As used herein,“erase dwell” refers to the time during which a storage location is inan erased state. Accordingly, the erase dwell time of a storage locationmay refer to the time between erasure of the storage location and thetime data is programmed on the storage location. What is needed aresystems and methods for managing storage location initialization toprolong the usable lifetime of the storage medium.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1A is a block diagram of one embodiment of a storage layer;

FIG. 1B is a schematic block diagram depicting one embodiment of astorage array;

FIG. 1C is a schematic block diagram depicting one embodiment of astorage medium comprising multiple banks;

FIG. 1D depicts embodiments of a storage medium having an availablewrite capacity, and comprising recoverable storage divisions;

FIG. 1E depicts embodiments of operations for reducing the erase dwelltime of a storage medium;

FIG. 1F depicts one embodiment for storage division selection;

FIG. 1G depicts further embodiments of operations for reducing the erasewell time of a storage medium;

FIG. 2A is a schematic block diagram of one embodiment of a storagemodule;

FIG. 2B depicts embodiments of storage log entries;

FIG. 2C depicts embodiments of storage division selection operations anderase dwell minimization for a storage log;

FIG. 3 is a flow diagram of one embodiment of a method for managingstorage erase operations;

FIG. 4 is a flow diagram of one embodiment of a method for efficientlyreducing erase dwell conditions;

FIG. 5 is a flow diagram of one embodiment of a method for managingerase dwell conditions on storage divisions of a storage medium;

FIG. 6 is a flow diagram of one embodiment of a method for reducingerase block wear due to erase dwell;

FIG. 7 is a flow diagram of one embodiment of a method for minimizingerase dwell of erase divisions of a storage medium;

FIG. 8 is a flow diagram of one embodiment of a method for selectingstorage resources for recovery;

FIG. 9 is a flow diagram of one embodiment of a method for determining aselection metric for garbage collection operations;

FIG. 10 is a flow diagram of one embodiment of a method for selecting astorage division to reclaim; and

FIG. 11 is a flow diagram of one embodiment of a method for selectingerase divisions for recovery based on invalid data metrics.

DETAILED DESCRIPTION

A storage layer may manage a storage medium comprising a plurality ofstorage units. As used herein, a “storage unit” or “physical storageunit” refers to a storage resource and/or storage location capable ofstoring a quantum of data. A storage unit may include, but is notlimited to: a page, a sector, a cell, a memory cell, a flash cell, aNAND cell, a block, a storage block, a group of physical storageresources (e.g., a set of two or more physical storage units), and/orthe like. The storage medium may comprise “write-once” storage units(e.g., erasable storage units). As used herein, a “write-once” storageunit refers to a storage unit that is initialized each time data iswritten thereto. A write-once storage location may only be capable ofbeing reliably programmed once, and must be erased before beingreprogrammed. A write-once storage unit may have a “writeable,”“initialized,” “reset,” or “erased” state in which the storage unit iscapable of having data reliably written thereto, and an “unwritable,”“written,” “non-reset,” and/or “non-erased” state in which the storageunit cannot be reliably programmed. A write-once storage location may bereset to a writable state. Resetting a storage unit may comprise erasingthe storage unit, reinitializing the storage unit, clearing the storageunit and/or the like. The disclosure is not limited in this regard,however, and could be adapted for use with storage units having writableand/or unwritable states that correspond to any media state and/orcondition.

Operations to reset storage units of the storage medium may besignificantly slower than operations to read data from the storage unitsand/or program data to the storage units (e.g., reading data from astorage unit may be hundreds of times faster than resetting the storageunit, and tens of times faster than programming data to the storageunit). Accordingly, in some embodiments, storage units are arranged intoreset groups (storage divisions). As used herein, a “storage division”refers to portions, sections, and/or regions within the storage medium.The storage divisions may comprise a set of two or more storage units.The storage units within a storage division may be managed as a group(e.g., may be reset as a group). Resetting a storage division may,therefore, comprise resetting the storage units of the storage division.A storage division may include, but is not limited to: an erase block,an erase division, an erase group, a logical erase block (e.g., a group,collection, and/or set of erase blocks), a reset group, a reset block, alogical reset block (e.g., a group, collection, and/or set of resetblocks), and/or the like. The storage layer may comprise a recoverymodule configured to reset storage divisions, such that the storagedivisions can be used to service incoming storage requests. The recoverymodule may be configured to implement reset operations on selectedstorage divisions to transition the storage divisions to a writablestate (e.g., erase the storage divisions). The recovery module may resetstorage divisions as part of a garbage collection operation, asdisclosed in further detail herein. The recovery module may be furtherconfigured to make the storage divisions available for servicing writerequests (e.g., place the storage divisions that have been reset into awrite queue). As disclosed in further detail herein, the recovery modulemay adapt reset operations on the storage divisions to reduce and/orminimize an erase dwell time of the storage divisions.

In some embodiments, write-once, asymmetric properties of the storagemedium may be managed by use of an independent logical-to-physicaltranslation layer between a logical address space corresponding to thestorage medium and the storage address space of the storage medium. Thelogical-to-physical translation layer may comprise any-to-any mappingsbetween the logical address space and physical storage resources, suchthat a logical identifier (LID) can map to any storage unit on thestorage medium. The logical-to-physical translation layer may beleveraged to implement storage operations “out-of-place” on the storagemedium. As used herein, writing data “out-of-place” refers to updatingand/or overwriting data stored on a particular storage unit by writingthe data to a different, available storage unit rather than overwritingthe data “in-place.” Due to the write-once characteristics of thestorage medium, updating a particular storage unit in-place may beinefficient and result in write amplification, since an in-place updatemay comprise: a) reading unmodified data from the storage divisioncomprising the particular storage unit, b) erasing the storage division,c) writing the updated data to the particular storage unit, and c)rewriting the unmodified data to the storage division. Updating and/oroverwriting data out-of-place may avoid write amplification, sinceexisting, valid data on the storage division need not be immediatelyerased and rewritten. Moreover, writing data out-of-place may removeerasure from the latency path of many storage operations. In someembodiments, data may be appended to an ordered storage log on thestorage medium.

Writing data out-of-place, as disclosed above, may result in consumingan available write capacity of the storage medium. As used herein, the“write capacity” of the storage medium refers to the amount of storageunits and/or storage divisions that available to service storagerequests. Accordingly, the write capacity of the storage medium maycorrespond to the physical storage capacity of the storage units thatare currently available for writing data (e.g., are currently in awritable state). Accordingly, the write capacity may differ from theavailable physical storage capacity of the storage medium, since thewrite capacity only includes storage units that are currently in awritable state, whereas the available physical storage capacity mayinclude storage units that could be made available to store data, butare currently in an unwritable state. A write stall may occur when theavailable capacity of writable storage units is exhausted (and/orreaches a threshold). In a write stall state, storage requests thatinvolve writing data to the storage medium may be stalled whileadditional write capacity is made available. Write stall conditions maysignificantly degrade performance due to, inter alia, asymmetry of resetoperations relative to read and/or write operations.

In some cases, one or more writable storage divisions are maintained inreserve in order to prevent write stall conditions. However, theinventors have determined, through testing and experience, that holdingstorage units in a writable, erased state may wear the storage medium,which can result in reducing the usable life of the storage medium. Asdisclosed above, the storage medium may have a limited useful life,which may be defined in terms of the number of program and/or eraseoperations the storage medium is expected to endure before failure. Theuseful life of the storage medium may, however, be further reduced byerase dwell. As used herein, “erase dwell” refers to the time duringwhich the storage medium is kept in an erased state. Accordingly, theerase dwell of a storage unit may comprise the time span from a) thetime the storage unit was erased to b) the time data is programmed tothe storage unit. In some embodiments, the erase dwell time of storageunits may be reduced and/or minimized by adapting erase operations sothat storage units transition to a writable state at the time thestorage units are needed for data write operations, rather than holdingwritable storage units in a reserve pool.

As used herein, “invalid” data refers to data that does not need to beretained on the storage medium 150. Invalid data may include, but is notlimited to: data that has been overwritten and/or modified out-of-place(e.g., data that has been rendered obsolete, as disclosed above); datathat has been erased, deleted, cleared, removed, deallocated, unmapped,TRIMed; unused data; data that has been evicted from a cache; cache datathat is discardable (e.g., has been written back to primary storage);and/or the like. Invalid data may be removed from the storage mediumthrough garbage collection operations. As used herein, a “garbagecollection” (GC) operation refers to an operation to remove invalid datafrom the storage medium and/or recover storage resources of the storagemedium. A garbage collection operation may include a) selecting astorage division for the GC operation, and b) resetting the storagedivision (by use of the recovery module, as disclosed above).

In some embodiments, the garbage collector comprises a selector modulethat selects storage divisions to reclaim by use of a primary selectionmetric and/or criterion. The primary selection metric may comprise a“free space” or “invalid data” metric. The “free space” metric of astorage division may quantify the amount of storage capacity freed byrecovering the storage division (e.g., the free space metric of astorage division having 90% of its physical storage capacity in use tostore invalid data may be expressed as a percentage, a ratio,0.9*SD_Capacity, where SD_Capacity is the physical storage capacity ofthe storage division, and/or the like). The “invalid data” metric mayquantify the amount of invalid data stored within a storage division(e.g., 90% invalid). The metrics disclosed herein may be expressed interms of percentages, ratios, physical storage capacity, and/or anyother suitable mechanism.

The selector module may use the free space and/or invalid data selectionmetric to identify and/or select storage divisions comprising largeramounts of invalid data for recovery. In some embodiments, recovering astorage division having a large amount of invalid data is preferredsince recovery operations on such storage divisions result in: a) lowerwrite amplification (less valid data to relocate from the storagedivision); and b) increased available storage capacity. By contrast,recovering a storage division that primarily comprises valid data mayresult in: a) increased write amplification (larger amount of valid datafor relocate), and b) freeing a smaller amount of storage capacity.

The storage medium may have a limited usable life, which may bequantified in terms of the number of program and/or erase cycles thatthe storage divisions are projected to be capable of enduring beforebecoming unusable. As used herein, an “unusable” storage division refersto a storage division that is no longer suitable for use to store datadue to, inter alia, media failure, interconnect failure, write errorrate, read error rate, write performance degradation, read performancedegradation, erase performance degradation, and/or the like. The storagelayer may be configured to manage wear levels of the storage divisionsso that the storage divisions wear evenly (e.g., prevent particularstorage divisions from being used more heavily than other storagedivisions, which may result in exhausting the usable life of theparticular storage divisions prematurely). As used herein, “wearleveling” refers to managing wear conditions on the storage medium, suchthat wear is distributed evenly throughout the storage address space ofthe storage medium (e.g., distributed evenly across storage divisionsand/or the storage units thereof). As used herein, a “wear condition” or“wear event” refers to any operation that consumes the usable life of aportion of the storage medium (e.g., a storage division and/or storageunit). Accordingly, wear conditions and/or wear events may include, butare not limited to: program and/or write cycles, read operations, eraseoperations, reset operations, initialization operations, program/erase(PE) cycles, erase dwell, and/or the like. The amount of wear incurredon a storage division may be quantified by use of a wear metric, whichmay correspond to one or more of: program and/or write cycle count, readoperation count, erase cycle count, reset cycle count, initializationcycle count, PE cycle count, erase dwell time, error rate, and/or thelike. Storage divisions may be retired in response to the wear metric ofthe storage division exceeding a threshold. A remaining life metric mayquantify the amount of remaining life of a storage division, and maycorrespond to one or more of: remaining number of PE cycles the storagedivision is projected to be capable of enduring, projected error rate,and so on. The remaining life metric of a storage division may bederived from the wear metric of the storage division (e.g., theremaining life metric of the storage division may be inverselyproportional to the wear metric of the storage division).

In one embodiment, the selector module is configured to adapt theprimary selection metric and/or criterion to wear level the storagemedium, while reducing write amplification. In one embodiment, theselector module modifies the invalid data metric to calculate a granularinvalid data metric (e.g., granularize and/or quantize the amount ofinvalid data in the storage divisions). As used herein, a “granularinvalid data metric” refers to a metric that quantifies the amount ofinvalid data in a storage division in terms of “granules” and/or“recovery blocks” (RB), which may represent a different quantum ofstorage capacity than the underlying block size of the storage division(e.g., may differ from the physical storage capacity of the storageunits within the storage division, storage block size, packet size,and/or the like). Calculating a “granular invalid data metric” of astorage division may, therefore, comprise mapping the amount of invaliddata stored within the storage division to a different, discrete set ofRB, which may correspond to a particular percentage of the full storagedivision capacity. In one embodiment, a storage division may comprise 1K storage units, each having an 8 K physical storage capacity (e.g., thestorage division may have a physical storage capacity of 8 MB).Accordingly, the “raw” or “full-resolution” invalid data metric for thestorage division may be defined in terms of the 8 K blocks, inaccordance with the storage unit size. The RB may be defined in terms of64 K blocks. Therefore, the granular invalid data metric for a storagedivision in which 896 of the 8K storage units comprise invalid data maybe calculated as 112 recovery blocks (7168 K of invalid data quantizedto 64 K RB). Invalid data values that do not map directly within adiscrete RB may be rounded up or down according to a quantizationpolicy. Although particular embodiments of granular metrics aredescribed herein, the disclosure is not limited in this regard, andcould be adapted to determine granular metrics using any suitablequantization, granularization, and/or data mapping technique.

The selector module may select storage divisions for recovery by use ofthe granular invalid data metrics, disclosed above. In accordance withthe greedy algorithm, the selector module may select storage divisionshaving higher granular invalid data metrics over storage divisionshaving lower granular invalid data metrics. The granular invalid datametrics disclosed herein may have a lower resolution than thefull-resolution, or raw invalid data metrics associated with the storagedivisions (e.g., the invalid data metrics of the storage divisions maybe defined in terms of 8 K blocks, whereas the granular invalid datametrics are defined in terms of larger, 64 K RB). Accordingly, storagedivisions having similar, but not equal, amounts of invalid data maycorrespond to the same quantized invalid data metric. In someembodiments, the selector module is configured to apply a secondaryselection metric to select one of two or more storage divisions havingthe same quantized invalid data metrics (and/or quantized invalid datametrics within a threshold). The secondary selection metric may beconfigured to wear level the storage medium and, as such, may correspondto a wear level of the two or more storage divisions (e.g., may selectthe storage division having the lower wear level and/or greaterremaining life metric). Alternatively, or in addition, the secondaryselection metric may correspond to data retention time, such that thestorage division with the longest time data retention is selected forrecovery. As used herein, the “data retention time” of a storagedivision refers to the length of time data has remained on the storagedivision. The data retention time of a storage division may refer to thetime that has elapsed since the storage division was closed (e.g., sincethe storage units thereof were programmed). Alternatively, the dataretention time may be defined as the time elapsed since the storagedivision was initialized and/or since data was first programmed to thestorage division after initialization (e.g., time elapsed since thestorage division was erased, reset, recovered, cleared, and/or thelike).

In some embodiments, the selector module is further configured toimplement an adaptive comparison of invalid data metrics pertaining tothe storage units. As used herein, an adaptive comparison refers to acomparison criterion that is a function of the relative amounts ofinvalid data within the storage divisions. The adaptive comparison may,therefore, be configured to adjust the resolution of the invalid datacomparison criterion (e.g., weight differences in invalid data metricsof the storage divisions) in accordance with the amount of invalid datawithin the storage divisions. In one embodiment, the adaptive comparisonis configured to reduce the weight of differences in the invalid datametrics when comparing storage divisions comprising relatively largeamounts of invalid data (since small differences in the overall amountof invalid data in the respective storage divisions is unlikely tosignificantly affect write amplification). By contrast, differences inthe invalid data metrics of storage divisions comprising smaller amountsof invalid data may be weighted more heavily (since recovery of suchstorage divisions is likely to create significantly more writeamplification). In one embodiment, the adaptive comparison may comprisea logarithmic comparison of the invalid data metrics of the storagedivisions (e.g., the approximate base 2 log of the raw and/or granularinvalid data metrics disclosed above). Storage divisions that result insimilar adaptive comparison results (and/or within a threshold) may beselected by use of a secondary selection metric, as disclosed above(e.g., based on wear level, data retention time, and/or the like).Although particular embodiments of adaptive comparisons are describedherein, the disclosure is not limited in this regard and could beadapted to implement an adaptive comparison of invalid data metrics (rawand/or granular) using any suitable technique.

In some embodiments, the selector module is configured to override theprimary selection metric and/or criterion with an alternative selectionmetric and/or criterion. The alternative selection metric may be adaptedto wear level the storage medium, such that storage divisions havinglower levels of wear are selected for GC and/or recovery over storagedivisions having lower levels of wear, despite differences in the amountof invalid data on the respective storage divisions. The alternativeselection metric may prevent storage divisions comprising “cold” and/orwrite-once-read-many (WORM) data from disuse and/or avoid concentrationof PE cycles in certain storage divisions. Overriding the primaryselection metric may comprise selecting a storage division to recoverbased on wear level and/or remaining life of the storage division asopposed to an invalid data metric. Storage divisions selected using awear level selection metric may result in increased write amplification(and/or free less storage capacity than a recovery operation on astorage division comprising a larger amount of invalid data).Accordingly, the selector module may limit overrides of the primaryselection metric to particular conditions. In one embodiment, theselector module may override the primary selection metric with thealternative selection metric in response wear level conditions on thestorage medium. In particular, the selector module may override theprimary selection metric in response to determining that storagedivision wear is not being evenly distributed across the storagedivisions. In one embodiment, the selector module is configured tooverride the primary selection metric in response to a differencebetween the wear level and/or remaining life metric of a storagedivision exceeding a threshold. Alternatively, or in addition, theselector module may be configured to override the primary selectionmetric in response to deltas, variances and/or deviation between wearlevel metrics of the storage divisions exceeding a threshold. In someembodiments, the selector module may further limit overrides of theprimary selection metric to a particular period and/or frequency (e.g.,an override per N selections using the primary selection metric).

Disclosed herein are embodiments of apparatus, systems, and methods formanaging erase operations on a storage medium. Embodiments of thedisclosed apparatus may comprise a storage manager configured to writedata to a first storage division of a solid-state storage medium, and anerase manager configured to initiate an erase operation on a secondstorage division of the solid-state storage medium in response to thestorage manager writing data to a threshold number of storage units ofthe first storage division. The erase operation may be initiated suchthat the erase operation completes before the writing of data to thefirst storage division. The erase manager may be configured to delay theerase of the second storage division until the threshold number ofstorage units of the first storage division are filled. The eraseoperation may be configured to reset the second storage division from anunwritable state to a writable state. The erase manager may beconfigured to retain the second storage division in the unwritable stateuntil data is programmed to the threshold of the storage capacity of thefirst storage division.

The threshold may be based on one or more of a projected fill time ofthe first storage division and a projected latency of the eraseoperation on the second storage division. The erase manager may beconfigured to determine the projected fill time of the first storagedivision based on one or more of a wear level of the first storagedivision, measured program latency of the first storage division,measured program latency of a plurality of storage divisions of thesolid-state storage medium, and a projected rate for write operations onthe first storage division. The projected latency of the erase operationon the second storage division may be based on one or more of a wearlevel of the second storage division, latency for previous eraseoperations performed on the second storage division, and a latency forprevious erase operations on other storage divisions of the solid-statestorage medium.

Embodiments of the apparatus disclosed herein may further include astorage division selector configured to select the second storagedivision for recovery. The erase manager may be configured to delay theerase operation on the second storage division in response to selectionof the second storage division for recovery by the storage divisionselector.

The erase manager is configured to delay the erase of the second storagedivision until the storage manager writes data to a third storagedivision of the solid-state storage medium. The storage manager may beconfigured to service write requests by sequentially writing data at anappend point within the first storage division, and wherein the erasemanager is configured to delay the erase operation on the second storagedivision based on a projected fill time of the first storage division.

The apparatus may further include a garbage collector configured toprepare the second storage division for the erase operation by, interalia, relocating valid data stored on the second storage division to oneor more other storage divisions of the solid-state storage medium,wherein the erase manager delays the erase operation on the secondstorage division after valid data is relocated from the second storagedivision.

Disclosed here are embodiments of a system for managing erase operationson a storage medium. Embodiments of the disclosed system may comprise alog storage module configured to append data to a storage log at anappend point within a current erase block of a non-volatile storagemedium, a recovery module configured to select another one of theplurality of erase blocks for use as a next append point for the logstorage module, wherein the selected erase block is in an unwritablestate, and an initialization module configured to hold the selectederase block in the unwritable state for an erase delay period. The erasedelay period may correspond to programming data to a predeterminednumber of pages within the current erase block. The initializationmodule may be configured to start an operation to transition theselected erase block to the writable state in response to programmingdata to the predetermined number of pages within the current eraseblock. The initialization module may be configured to transition theselected erase block to the writable state in response to appending athreshold amount of data within the current erase block. The erase delayperiod may be configured to schedule completion of the operation totransition the selected erase block to the writable state at a projectedfill time of the current erase block. The erase delay period maycorrespond to a difference between a) a projected fill time of thecurrent erase block, and b) a projected latency of an erase operation totransition the selected erase block to a writeable state. In someembodiments, the erase delay period is based on write rate projection,and wherein the initialization module determines the write rateprojection by monitoring write operations performed by the log storagemodule.

Disclosed herein are embodiments of a method for managing a storagemedium, comprising programming data to erased storage locations withinrespective erase divisions of a solid-state storage medium, minimizingan erase dwell time of the erased divisions by leaving erase divisionsin a non-erased state until a write capacity threshold is satisfied,wherein the write capacity threshold corresponds to a storage capacityof erased storage locations on the solid-state storage medium, andtransitioning a selected erase division to an erased state in responseto determining that the write capacity condition is satisfied.Satisfying the write capacity condition may comprise determining thatthat solid-state storage medium comprises fewer than a threshold numberof erased storage locations. Embodiments of the disclosed method mayfurther include scheduling two or more erase operations to transitiondifferent respective sets of storage locations of the selected erasedivision to the erased state.

In some embodiments, the disclosed method further comprises programmingdata to a first one of a plurality of erase divisions of the solid-statestorage medium, and determining that the write capacity threshold issatisfied in response to filling a threshold portion of a storagecapacity of the first erase division. Embodiments of the methoddisclosed herein may include preparing the selected erase division to beerased, and leaving the selected erase division in the non-erased stateafter preparing the selected erase division to be erased until the writecapacity condition is satisfied. Preparing the selected erase divisionto be erased may comprise relocating valid data stored on the selectederase division to one or more other erase divisions of the solid-statestorage medium.

Disclosed herein are apparatus, systems, and methods for selectingstorage divisions for recovery. Embodiments of the disclosed apparatusmay comprise a storage controller configured to write data to storagedivisions of a solid-state storage medium, a garbage collectorconfigured to reclaim storage divisions for use by the storagecontroller, and a garbage collection selector configured to selectstorage divisions for the garbage collector to reclaim capacity by useof a first selection metric, wherein the garbage collection selector isconfigured to override the first selection metric with a second,different selection metric that corresponds to a wear level of therespective storage divisions in response to differences in the amount ofwear on one or more of the storage divisions exceeding a threshold. Thegarbage collection selector may be configured to calculate the wearvariance between the one or more storage divisions as a differencebetween a wear level of the respective storage divisions and an averagewear level of the storage divisions. The garbage collection selector maybe configured to determine the wear level between the two or morestorage divisions by use of a wear distribution of the storagedivisions. The garbage collection selector may be configured to overridethe first selection metric in response to a difference between a highestwear level of the storage divisions and a lowest wear level of thestorage divisions exceeding the threshold. The garbage collectionselector may be further configured to limit overrides of the firstselection metric in accordance with a predetermined override rate. Insome embodiments, the garbage collection selector limits overrides ofthe first selection metric to one override per N storage divisionselections made by use of the first selection metric.

The first selection metric may quantify an amount of invalid data storedon the respective storage divisions. Overriding the first selectionmetric may comprise selecting a storage division to reclaim based onwear levels of the respective storage divisions, independent of theamount of invalid data stored on the respective storage divisions. Inone embodiment, the storage divisions comprise a plurality of storageblocks. The first selection metric may quantify storage capacity thatwould be freed by reclaiming the respective storage divisions in termsof virtual storage blocks that correspond to a physical storage capacityof two or more storage blocks of the storage divisions. The firstselection metric may exclude storage divisions comprising less than athreshold amount of invalid data from being selected to reclaim. In someembodiments, the first selection metric corresponds to a logarithm of anamount of invalid data stored within the respective storage divisions.

Disclosed herein are embodiments of a system for selecting storagedivisions for recovery. Embodiments of the disclosed system may comprisea storage module configured to manage a storage medium comprising aplurality of erase divisions, each erase division comprising a pluralityof physical storage locations, a selector module configured to select anerase division to initialize for use in servicing write requests by thestorage module, wherein selecting the erase division to initializecomprises calculating an amount of invalid data within the erasedivisions in terms of a recovery block size, wherein the recovery blocksize exceeds a storage capacity of the respective physical storagelocations of the erase divisions, selecting the erase division toinitialize based on an adaptive comparison of the calculated amounts ofinvalid data within the respective erase divisions, and a garbagecollector to recover the selected erase division for reuse by thestorage module in response to the selection. The selector module may beconfigured to exclude erase divisions having less than a thresholdamount of invalid data from the selection.

The selector module may be further configured to determine a deviationof wear metrics of the erase divisions, wherein the wear metric of anerase division is based on one or more of a program count of the erasedivision, an erase count of the erase division, a PE cycle count of theerase division, and an error rate of the erase division. The selectormodule may be further configured to select the erase division toinitialize based on wear metrics of the erase divisions in response tothe deviation of the wear metrics of the erase divisions exceeding athreshold.

Disclosed herein are embodiments of a method for selecting an eraseblock for recovery. The disclosed method may comprise maintainingstorage metadata pertaining to erase blocks of a solid-state storagemedium, the storage metadata comprising a remaining life metric thatcorresponds to a projected remaining usable life of the respective eraseblocks, and a free space metric that quantifies an amount of storagecapacity freed by resetting the respective erase blocks to a writeablestate, selecting an erase block to reset by determining a deviationwithin the remaining life metrics, selecting the erase block to resetbased on the remaining life metrics of the erase blocks in response todetermining that the determined deviation satisfies a deviationthreshold, and selecting the erase block to reset based on the freespace metrics of the erase blocks in response to determining that thedetermined deviation does not satisfy the deviation threshold. Themethod may further include resetting the selected erase block to awriteable state.

In some embodiments, the method further comprises determining the freespace metric of an erase block by quantizing an amount of data stored onthe erase block that does not need to be retained on the solid-statestorage medium in terms of discrete blocks, each discrete blockrepresenting a physical storage capacity greater than a physical storagecapacity of a physical page. Alternatively, or in addition, thedisclosed method may include determining logarithmic free space metricsof the erase blocks, wherein the logarithmic free space metric of anerase block comprises a logarithm of a number of physical pages withinthe erase block that store invalid data, wherein selecting the eraseblock to reset based on the free space metrics comprises comparing thelogarithmic free space metrics of the respective erase blocks.

Selecting the erase block to reset based on the free space metrics maycomprise selecting the erase block that would free the most physicalstorage capacity in response to being reset. Alternatively, or inaddition, selecting the erase block to reset based on the free spacemetrics may comprise selecting the erase block to reset by comparingremaining life metrics of a set of two or more erase blocks having freespace metrics that differ by less than a threshold. The remaining lifemetric of a storage division may correspond to one or more of: programcount, erase count, program erase cycle count, and error rate.Embodiments of the disclosed method may further include limiting use ofthe remaining life metrics to select the erase block to reset inaccordance with a predetermined rate.

FIG. 1A is a schematic block diagram of one embodiment 101 of acomputing system 100 comprising a storage services layer (storage layer110). In some embodiments, the storage layer 110 comprises a computingsystem 100 (and/or may be configured for operation on a computing system100). The computing system 100 may comprise one or more computingdevices, including, but not limited to: a server, a desktop, a laptop,an embedded system, a mobile device, a storage device, anetwork-attached storage device, a storage appliance, a plurality ofcomputing devices (e.g., a cluster), and/or the like. The computingsystem 100 may comprise processing resources 102, memory resources 103(e.g., volatile random access memory (RAM)), non-transitory storageresources 104, and/or a communication interface 105. The processingresources 102 may include, but are not limited to: general purposecentral processing units (CPUs), ASICs, programmable logic elements,FPGAs, programmable logic arrays (PLGs), and/or the like. Thecommunication interface 105 may be configured to communicatively couplethe computing system 100 to a network 106. The network 106 may compriseany suitable communication network, including, but not limited to: aTransmission Control Protocol/Internet Protocol (TCP/IP) network, aLocal Area Network (LAN), a Wide Area Network (WAN), a Virtual PrivateNetwork (VPN), a Storage Area Network (SAN), and/or the like.

As disclosed in further detail herein, the storage layer 110 maycomprise an interface 111, a storage manager 112, a media controller116, a translation module 120, and a media manager 130. The storagelayer 110 (and/or modules, components, and/or functionality thereof) maybe implemented in software, hardware, and/or a combination of softwareand hardware elements. In some embodiments, portions of the storagelayer 110 are embodied as executable instructions stored on anon-transitory, machine-readable storage medium. The instructions maycomprise computer program code that, when executed by a processor and/orcomputing device, causes the processing resources 102 of the computingsystem 100 to implement certain processing steps, procedures, and/oroperations disclosed herein. The storage layer 110, and/or portionsthereof, may be implemented and/or embodied as a driver, a library, aninterface, an API, FPGA configuration data, firmware (e.g., stored on anElectrically Erasable Programmable Read-Only Memory (EEPROM) and/or thelike), and/or the like. Accordingly, portions of the storage layer 110may be accessed by and/or included within other modules, processes,and/or services (e.g., incorporated within a kernel layer of anoperating system of the computing system 100). In some embodiments,portions of the storage layer 110 are embodied as machine components,such as general and/or application-specific devices, including, but notlimited to: circuits, integrated circuits, processing components,interface components, hardware controller(s), storage controller(s),programmable hardware, FPGAs, ASICs, and/or the like. The modulesdisclosed herein may be referred to as controllers, layers, services,engines, facilities, drivers, circuits, and/or the like. Therefore, insome embodiments, the storage layer 110 may be referred to as a storagedevice, storage controller, storage manager, storage layer, storageengine, storage facility, storage driver, storage circuit, and/or thelike.

The storage layer 110 may be configured to provide I/O and/or storageservices to clients 107, which may include, but are not limited to:operating systems, file systems, journaling systems, key-value storagesystems, database systems, applications, users, remote storage clients,and/or the like. The clients 107 may further include, but are notlimited to: components of a virtualized computing environment, such ashypervisors, virtualization kernels, guest operating systems, virtualmachines, and/or the like. The storage layer 110 may comprise aninterface 111 through which the clients 107 access the storage servicesof the storage layer 110. The interface 111 may include one or moreblock storage interfaces, object storage interfaces, file storageinterfaces, key-value storage interfaces, storage namespaces, databasestorage interfaces, directory storage interfaces, virtualized storageinterfaces, Virtual Storage Unit (VSU) interfaces, Logical Unit Number(LUN) interfaces, virtual LUN (vLUN) interfaces, logical address spaces,and/or the like.

The storage layer 110 may service storage requests received through theinterface by implementing storage operations on a storage medium 150using, inter alia, the storage manager 112, media controller 116,translation layer 120, and/or media manager 130. The storage medium 150may comprise non-volatile and/or persistent storage medium including,but not limited to: flash memory, nano random access memory (nano RAM orNRAM), nanocrystal wire-based memory, silicon-oxide based sub-10nanometer process memory, graphene memory,Silicon-Oxide-Nitride-Oxide-Silicon (SONOS), Resistive Random-AccessMemory (RRAM), Programmable Metallization Cell (PMC),Conductive-Bridging RAM (CBRAM), Magneto-Resistive RAM (MRAM), DynamicRAM (DRAM), Phase change RAM (PRAM), and/or the like. Alternatively, orin addition, the storage medium 150 may comprise volatile storageresources, which may include, but are not limited to: RAM, dynamic RAM(DRAM), static RAM (SRAM), synchronous dynamic RAM (SDRAM), cache memoryresources, graphics memory resources, and/or the like.

The storage medium 150 may comprise a plurality of storage units 152,which may be grouped, organized, arranged and/or partitioned intorespective storage divisions 154. As disclosed above, a “storage unit”or “physical storage unit” refers to a storage resource capable ofstoring a quantum of data. In the FIG. 1A embodiment, a storage unit 152may include, but is not limited to: a page, a sector, a cell, a memorycell, a flash cell, a NAND cell, a block, a logical storage unit (e.g.,a group or set of storage locations), and/or the like. The storage units152 may, therefore, comprise storage locations that the storage manager112 may use to service storage requests. In some embodiments, a storageunit 152 may comprise a plurality of physical storage locations ondifferent respective storage elements, as disclosed below in conjunctionwith FIG. 1B.

As disclosed herein, the storage medium 150 may comprise “write-once”storage units 152. As used herein, a “write-once” storage unit 152refers to a storage unit 152 that is initialized each time data iswritten thereto. A write-once storage unit 152 may only be capable ofbeing reliably programmed once, and must be erased before beingreprogrammed. A write-once storage unit 152 may have a writeable statein which the storage unit 152 is capable of having data reliably writtenthereto, and an unwritable state in which the storage unit 152 cannot bereliably programmed. The storage layer 110 may comprise an erase module138 configured to transition a storage division 154 (and the storageunits 152 therein) to a writable state, which may comprise resetting thestorage division 154, clearing the storage division 154, erasing thestorage division 154, and/or the like. The disclosure is not limited inthis regard, however, and could be adapted for use with storage units152 and/or storage divisions 154 having writable and/or unwritablestates that correspond to any media state and/or condition.

Reset operations may be significantly slower than other storageoperations on the storage medium 150 (e.g., reading data from a storageunit 152 may be hundreds of times faster than resetting the storage unit152, and tens of times faster than programming data to the storage unit152). Accordingly, in some embodiments, storage units 152 are grouped,arranged, and/or partitioned into respective storage divisions 154. Asdisclosed above, a storage division 154 refers to a portion, section,and/or segment of the storage medium 150. A storage division 154 maycomprise two or more storage units 152. The storage units 152 within astorage division 154 may be managed as a group (e.g., may be initializedas a group). Resetting a storage division 154 may comprise resetting thestorage units 152 within the storage division 154. The storage divisions154 of FIG. 1A may comprise, but are not limited to: erase blocks, erasedivisions, erase groups, logical erase blocks (e.g., groups,collections, and/or sets of erase blocks), reset groups, reset blocks,logical reset blocks (e.g., groups, collections, and/or sets of resetblocks), and/or the like. In some embodiments, a storage unit 152 maycomprise a plurality of physical erase blocks on different respectivestorage elements, as disclosed below in conjunction with FIG. 1B.

The storage units 152 and/or storage divisions 154 may be addressablewithin a storage namespace of the storage medium 150 (storage addressspace 151). The storage address space 151 may include, but is notlimited to: storage addresses, storage identifiers, physical addresses,physical storage addresses, physical identifiers, physical storageidentifiers, media addresses, media identifiers, back-end addresses,back-end identifiers, address offsets, and/or the like. The storageaddress space 151 may correspond to any suitable storage addressingscheme, namespace, arrangement, and/or organization of storageresources.

The storage medium 150 may be communicatively coupled to an interconnect108. The interconnect 108 may include, but is not limited to: aperipheral component interconnect (PCI), a PCI express (PCI-e) bus, aSerial AT Attachment (serial ATA or SATA) bus, a parallel ATA (PATA)bus, a Small Computer System Interface (SCSI) bus, an IEEE 1394(FireWire) interface, a Fiber Channel interface, a Universal Serial Bus(USB) connection, and/or the like. In some embodiments, the storagemedium 150 comprises a remote storage medium and/or device that arecommunicatively coupled to the storage layer 110 through the network106. The interconnect 108 may, therefore, comprise one or more of: anetwork connection and/or interface, a storage network interface, aStorage Area Network (SAN) interface, a Virtual Storage Area Network(VSAN) interface, a remote bus, a PCE-e bus, an Infiniband connection, aFibre Channel Protocol (FCP) network connection, a HyperSCSI interface,and/or the like.

In some embodiments, the storage medium 150 and/or storage layer 110 areembodied on a storage device 109. The storage device 109 may compriseone or more of: an on-board storage device of the computing system 100(e.g., a chip, components, and/or module of the computing system 100),an expansion card communicatively coupled to an I/O bus of the computingsystem 100 (e.g., a PCIe card), a storage resource communicativelycoupled to a storage bus of the computing system 100 (e.g., a storagedrive communicatively coupled to a SATA bus of the computing system100), an external storage device communicatively coupled to an externalbus of the computing system 100 (e.g., USB, Firewire, and/or the like),a storage appliance (e.g., an independent, stand-alone computing device,storage server, etc.), and/or the like. Portions of one or more of thestorage layer 110, storage manager 112, media controller 116,translation module 120, media manager 130, and/or other modules,components, and/or facilities disclosed herein may be implemented on thestorage device 109. Accordingly, in some embodiments, the modules,components, elements and/or facilities disclosed herein may be embodiedas circuits, controllers, programmable logic hardware, configurationfirmware of the storage device 109 (and/or computing system 100), and/orthe like.

The media controller 116 may be configured to implement storageoperations on the storage medium 150, which may include, but are notlimited to: writing data to storage unit(s) 152 of the storage medium150 (by use of a write module 117), reading data from storage unit(s)152 of the storage medium 150 (by use of a read module 119),initializing storage units 152 (e.g., erasing and/or resetting storagedivisions 154), detecting and/or correcting errors, and so on. The mediacontroller 116 may comprise software and/or hardware componentsincluding, but not limited to: one or more drivers and/or other softwaremodules operating on the computing system 100, such as firmware, storagedrivers, I/O drivers, filter drivers, and/or the like; hardwarecomponents, such as hardware controllers, programmable controllers,circuits, communication interface(s), and/or the like; and so on. In oneembodiment, the storage medium 150 and/or media controller 116 areembodied on a storage device 109.

The media controller 116 may comprise circuitry, buffers, buses, businterfaces, communication interfaces (e.g., direct memory access (DMA)controllers) configured to: access data for storage on the storagemedium 150, program data to respective storage units 152 of the storagemedium 150, read data stored on storage units 152 of the storage medium150, provide data read from the storage medium 150 to client(s) 107(e.g., through the interconnect 108 and/or other communicationinterface), and/or reinitialize storage units 152, as disclosed infurther detail herein. The media controller 116 may be furtherconfigured to gather profiling information pertaining to storageoperations performed on the storage medium 150, such as the errorrate(s) of storage operations on particular storage divisions 154 and/orstorage units 152, wear levels of the storage divisions 154 (e.g.,program erase counts), erase dwell time of the storage divisions 154(e.g., time span from a reset operation on a storage division 154 to thetime data is programmed thereto), erase latency (e.g., time to implementan erase and/or reset operation on the storage divisions 154), writelatency (e.g., time to write data to a storage division 154 and/orstorage units 152 within a storage division 154), and so on. The mediacontroller 116 may report the profiling metadata to the storage manager112, which may record the profiling information in the profilingmetadata 129.

Referring to FIG. 1B, in some embodiments, the storage medium 150comprises a storage array 155 that includes a plurality of storageelements 156A-Y (e.g., columns 158). As used herein, a storage element156A-Y includes, but is not limited to: solid-state storage resourcesembodied as a package, chip, die, plane, printed circuit board, and/orthe like. The storage array 155 of FIG. 1B comprises a set of two ormore independent columns 158, comprised of one or more storage elements156A-Y. The rows 157 of the array 155 may comprise storage units 152 ofthe respective columns 158 (e.g., storage elements 156A-Y). The storageelements 156A-Y comprising the storage array 155 may be capable ofindependent operation. Accordingly, a first one of the storage elements156A may be capable of performing a first storage operation while asecond storage element 156B performs a different storage operation. Inone embodiment, the storage element 156A may be configured to read dataat a first storage address, while another storage element 156B readsdata at a different storage address.

The storage elements 156A-Y of the storage array 155 may becommunicatively coupled to the media controller 116 by a bus 118. Thebus 118 may be configured to communicatively couple the storage elements156A-Y in parallel, such that the media controller 116 is capable ofcommunicating with each of the respective storage elements 156A-Yindependently. Alternatively, or in addition, portions of the bus 118may be shared between storage elements 156A-Y.

The media controller 116 may perform storage operations in parallel onmultiple storage elements 156A-Y. In one embodiment, the mediacontroller 116 arranges the physical storage resources of the storagearray 155 to form storage units 152 and/or storage divisions 154 thatspan multiple storage elements 156A-Y. The media controller 116 mayperform write and/or read operations on storage units 152 comprisingrows 157 within the storage array 155. As used herein, a row 157 of thestorage array 155 refers to a combination of two or more physicalstorage locations on respective storage elements 156A-Y of the storagearray 155 (e.g., on different respective columns 158). Accordingly, astorage unit 152 within the storage array 152 may comprise a pluralityof individual physical storage locations, spanning a row 157 within thestorage array 155. As illustrated in FIG. 1B, a storage unit 152 of thestorage array 155 may comprise a plurality of physical storagelocation(s) within a plurality of different storage elements 156A-Y(within a row 157 of the storage array 155). Programming data to astorage unit 152 of the storage array 155 may, therefore, compriseprogramming data to a plurality of different physical storage locationson a plurality of different storage elements 156A-Y. A storage division154 of the storage array 155 may comprise a plurality of erase blocks159 within respective columns 158 (e.g., a row 157 of erase blocks 159).Accordingly, resetting a storage division 154 of the storage array 155may comprise resetting a plurality of erase blocks 159 on respectivestorage elements 156A-Y. Although a particular configuration of astorage array 155 is described herein, the disclosure is not limited inthis regard and could be adapted to manage storage units 152 and/orstorage divisions 154 corresponding to any suitable arrangement ofstorage elements 156A-Y, storage arrays 155, banks, and/or the like.

FIG. 1C depicts one embodiment of storage medium 150 comprising aplurality of independent banks 151A-N, each comprising one or morestorage arrays 155A-N. Each of the independent banks 151A-N may becommunicatively coupled to the media controller 116 via a respective bus118A-N. The media controller 116 may be configured to perform storageoperations on the respective banks 151A-N independently (e.g., mayinterleave storage operations between the different banks 151A-N). Insome embodiments, the storage units 152 and/or storage divisions 154 maybe organized within respective banks 151A-N (e.g., within respectivestorage arrays 155A-Y). In alternative embodiments, storage units 152and/or storage divisions 154 may span two or more banks 151A-N and/orstorage arrays 155A-N.

Referring back to FIG. 1A, the media controller 116 may be configuredto, inter alia, manage data errors pertaining to storage operations onthe storage medium 150. In some embodiments, media controller 116comprises a write module 117 configured to program data segments to thestorage medium 150. As used herein, a data segment refers to any quantumof data including, but not limited to: data pertaining to a storagerequest, data corresponding to one or more logical identifiers, one ormore data blocks, unstructured data (e.g., data blobs), structured data,a data packet 145 (disclosed below), a data container, a data set, adata range, a data extent, a data record, an object, a data object,and/or the like. The write module 117 may comprise circuits, buffers,and/or modules to generate and/or write error recovery datacorresponding to the data segments, which may include, but are notlimited to: error-correcting code (ECC) data, redundant data, paritydata, and/or the like. The write module 117 may include an ECC encodecircuit configured to encode data segments for storage on the storagemedium 150 as ECC codewords and/or with ECC syndromes. The mediacontroller 116 may further include a read module 119 configured toidentify and/or correct data errors by use of error recovery data on thestorage medium 150. The read module 119 may include an ECC decodecircuit configured to identify and/or correct data errors in the ECCencoded data read from the storage medium 150. In some embodiments, themedia controller 116 further includes a media tuning circuit configuredto adjust media tuning parameters used to read data from the storagemedium 150 (e.g., modify bit detection thresholds and/or the like)and/or a parity substitution circuit configured to correct data errorsby use of parity substitution operations, as disclosed herein.

As disclosed above, the media controller 116 may be configured to storedata redundantly and/or with parity data. Referring to the storage array155 illustrated in FIG. 1B, the media controller 116 may be configuredto store data redundantly on two or more different storage elements156A-Y (e.g., two or more different columns 158 of the storage array155). Data that cannot be recovered from a first one of the storageelements 156A-Y may be read from a different one of the storage elements156A-Y. Alternatively, or in addition, the media controller 116 may beconfigured to store parity data on the storage array 155. In oneembodiment, the media controller 116 is configured to store data withinrespective rows 157 of the storage array 155 (e.g., store data to aplurality of different storage elements 156A-Y in parallel). The mediacontroller 116 may use one of the storage elements (e.g., storageelement 156Y) to store parity data corresponding to data stored in otherstorage elements 156A-N of the storage array 155. Accordingly, anoperation to program data to particular row 137 may comprise a)calculating parity data corresponding to the data to be programmed tothe storage elements 156A-N, and b) programming the data to storageelements 156A-N and programming the parity data to storage element 156Y.An error pertaining to data stored in one or more of the storageelements 156A-N that cannot be corrected by use of ECC information maybe corrected by parity substitution, which may comprise a) decoding ECCdata stored on other elements 156A-N and/or the parity storage element156Y, and b) recovering the unreadable data by use of paritysubstitution (e.g., using the decoded ECC data and/or parity data).

The storage layer 110 may maintain a front-end storage interfacecorresponding to the storage medium 150. As used herein, a “front-endstorage interface” or “logical interface” refers to an interface and/ornamespace through which clients 107 may access the storage servicesprovided by the storage layer 110. In the FIG. 1A embodiment, thestorage layer 110 maintains a logical address space 121 corresponding tothe storage medium 150, by use of the translation module 120. Thelogical address space 121 may comprise a group, set, collection, range,and/or extent of identifiers. As used herein, an “identifier” or“logical identifier” (LID) refers to an identifier for referencing astorage and/or I/O resource; LIDs may include, but are not limited to:names (e.g., file names, distinguished names, and/or the like), dataidentifiers, references, links, front-end identifiers, logicaladdresses, logical block addresses (LBAs), storage unit addresses,virtual storage unit (VSU) addresses, logical unit number (LUN)addresses, virtual unit number (VUN) addresses, virtual logical unitnumber (vLUN) addresses, virtual storage addresses, storage addresses,physical addresses, media addresses, back-end addresses, uniqueidentifiers, globally unique identifiers (GUIDs), and/or the like.

The logical capacity of the logical address space 121 may correspond tothe extent, range, and/or number of LIDs in the logical address space121 and/or the size and/or granularity of storage resources representedby the respective LIDs. The logical address space 121 maintained bytranslation module 120 may be independent of the underlying storagemedium 150, such that any LID within the logical address space 121 canbe mapped to any storage unit(s) 152 on the storage medium 150 (e.g.,any particular storage unit 152, portion of a storage unit 152, and/orset of storage units 152). In some embodiments, the logical addressspace 121 may be “sparse,” “thinly provisioned,” and/or “overprovisioned.” As used herein, a thinly provisioned or over provisionedlogical address space 121 refers to a logical address space 121 having alogical capacity that is independent of the physical storage capacityand/or granularity of the underlying storage resources (e.g.,independent of the physical storage capacity and/or storage addressspace 151 of the storage medium 150). Accordingly, the logical addressspace 121 may be independent of the underlying storage resources, suchthat there are no set or predetermined mappings between the logicaladdress space 121 and the storage address space 151. The logical addressspace 121 may be “sparse,” such that physical storage resourcescorresponding to a particular LID of the logical address space 121 arenot reserved and/or consumed until data is written to the particularLIDs. In one embodiment, the logical address space 121 comprises 64-bitLIDs (e.g., 2^26 unique LIDs). The storage layer 110 may leverage thesparse, thinly provisioned logical address space 121 to efficientlyallocate and/or reference contiguous ranges of LIDs and/or managemany-to-one mappings between LIDs and physical storage resources. Thestorage layer 110 may allocate logical capacity to clients 107 by, interalia, allocating LIDs within the logical address space 121. Allocating aLID may comprise reserving a LID for use by a particular client 107.Reserving and/or allocating a LID may not result in reserving physicalstorage resources on the storage medium 150 until physical storagecapacity is explicitly reserved and/or data is written to the LIDs.

The storage layer 110 may be further configured to maintain storagemetadata 124, which may include, but is not limited to: a forward map125 comprising any-to-any mappings between LIDs of the logical addressspace 121 and the storage address space 151, a reverse map or validitymap 127 pertaining to the contents of particular storage units 152and/or storage divisions 154, and/or profiling metadata 129 pertainingto wear level(s) of the storage divisions 154, storage division errorrate, storage performance metrics (e.g., latencies of erase and/or writeoperations), and so on. Portions of the storage metadata 124 may bemaintained within the volatile memory resources 103 of the computingsystem 100. Alternatively, or in addition, portions of the storagemetadata 124 may be stored on non-volatile storage resources 104 and/orthe storage medium 150.

The translation module 120 may be configured to associate, bind, map,tie, and/or assign LIDs of the logical address space 121 to data storedon the storage medium 150 by use of the storage metadata 124. Asillustrated in FIG. 1B, the translation module 120 may be configured tomap LIDs to particular storage units 152 by use of the forward map 125.The forward map 125 may comprise a translation layer between the logicaladdress space 121 and the storage address space 151, wherein any LID iscapable of being mapped to any storage unit 152 (and vice versa). Insome embodiments, the forward map 125 may further include anintermediate mapping layer in which LIDs are mapped to intermediateaddresses of an intermediate address space and/or virtual identifiers(VIDs) of a virtual address space, which are mapped to respectivestorage units 152.

The logical address space 121 may be independent of the storage addressspace 151 of the storage medium 150. As illustrated in FIG. 1B, thelogical address space 121 may be sized differently than the underlyingstorage address space 151 (e.g., may represent a logical capacity thatexceeds the physical storage capacity of the storage medium 150 and/orcomprise a larger number of LIDs than available storage units 152). Thetranslation module 120 may maintain and/or represent the forward map 125using any suitable data structure, including, but not limited to: anindex, a map, a hash map, a hash table, a tree, a range-encoded tree, ab-tree, a radix tree, a trie, a prefix tree, a compact prefix tree,and/or the like. The forward map 125 may comprise entries 126corresponding to LIDs that are being used to reference data stored onthe storage medium 150. The entries 126 of the forward map 125 mayassociate LIDs with respective storage addresses within the storageaddress space 151. The forward map 125 may be sparsely populated, and assuch, may omit entries 126 corresponding to LIDs that are not currentlyin use to reference stored data, regardless of whether the LIDs havebeen allocated and/or reserved by a client 107. In some embodiments, theforward map 125 comprises one or more range-encoded entries 126 thatcorrespond to a plurality of LIDs (e.g., a range, extent, and/or set ofLIDs). In the FIG. 1B embodiment, the forward map 125 includes an entry126 that maps a range of LIDs (LIDs 34-35) to a corresponding range ofstorage addresses (16987-16988). The entries 126 of the forward map 125are indexed and/or referenced by LID (e.g., in a tree data structure).The disclosure is not limited in this regard, however, and could beadapted to use any suitable data structure and/or indexing mechanism.

In some embodiments, the storage metadata 124 may further compriseinformation to distinguish valid from invalid data stored on the storagemedium 150. As used herein, “invalid” data refers to data that does notneed to be retained on the storage medium 150. Invalid data may include,but is not limited to: data that was been overwritten out-of-place byother, more recent data (e.g., obsolete data); data that has beenerased, deleted, cleared, removed, deallocated, unmapped, TRIMed, or thelike; unused data; data evicted from a cache; and/or the like. Thevalidity map 127 may comprise and/or reference respective validitybitmaps 128A-N pertaining to respective storage divisions 154A-N. Thevalidity bitmaps 128A-N may identify valid and/or invalid data stored onthe storage units 152 of the respective storage divisions 154A-N.

In some embodiments, the storage layer 110 may be configured to managewrite-once, asymmetric properties of the storage medium 150 by use ofthe independent logical-to-physical translation layer maintained by thetranslation module 120. As disclosed herein, the logical-to-physicaltranslation layer may comprise any-to-any mappings between the logicaladdress space 121 and physical storage resources, such that a LID canmap to any storage unit 152 on the storage medium 150. Thelogical-to-physical translation layer may be leveraged to implementstorage operations “out-of-place,” on the storage medium 150. Asdisclosed above, writing data “out-of-place” refers to updating and/oroverwriting data stored on a particular storage unit by writing the datato an available, writable storage unit 152 rather than overwriting thedata “in-place.” Updating a particular storage unit 152 in-place mayresult in write amplification, since an in-place update may comprise: a)reading unmodified data from the storage division 154 comprising theparticular storage unit 152, b) erasing the storage division 154, c)writing updated data to the particular storage unit 152, and c)rewriting unmodified data back to the storage division 154. Updatingand/or overwriting data out-of-place may avoid write amplification sinceexisting, valid data on the storage division 154 need not be immediatelyerased and rewritten. Moreover, writing data out-of-place may removeerasure from the latency path of many storage operations.

Implementing storage operations out-of-place may result in: a)accumulation of invalid data on the storage medium 150, and/or b)consume an available write capacity on the storage medium 150. Asdisclosed above, “invalid data” refers to data that does not need to beretained on the storage medium 150. Invalid data may include, but is notlimited to: data that has been overwritten and/or modified out-of-place(e.g., data that has been rendered obsolete, as disclosed above); datathat has been erased, deleted, cleared, removed, deallocated, unmapped,TRIMed; unused data; data that has been evicted from a cache; cache datathat is discardable (e.g., has been written back to primary storage);and/or the like. The “write capacity” available on the storage medium150 refers to physical storage capacity of the storage units 152 thatare in a writeable state. The available write capacity may differ fromthe physical storage capacity of the storage 150. FIG. 1D depicts oneembodiment of a storage address space 151 of the storage medium 150. Inthe FIG. 1D embodiment, the storage medium 150 comprises storagedivisions 154A-N, each of which comprise P storage units 152. Storagedivision 154A comprises storage units 152[A][1]-152[A][P], storagedivision 154B comprises storage units 152[B][1]-152[B][P], storagedivision 154N comprises storage units 154[N][1]-154[N][P], and so on.The storage units 152[N][1]-152[N][P] may be in a writable state, andthe other storage units 152 of the storage medium 150 may be in anunwritable state. Accordingly, the available write capacity of thestorage medium 150 corresponds to P storage units 152. The storagemedium 150 comprises P+3 storage units 152 that are currently storinginvalid data that does not need to be retained on the storage medium 150(e.g., storage units 152[A][1]-152[A][P] and 152[B][1]-152[B][3] asindicated by the validity bitmaps 128A and 128B corresponding to storagedivisions 154A and 154B in the validity metadata 127). The available or“free” physical storage capacity on the storage medium 150, therefore,corresponds to 2P+3 storage units 152 (the storage capacity of the Pwritable storage units 152 of storage division 154N and the P+3 storageunits 152 currently storing invalid data). However, since storage units152[A][1]-152[A][P] and 152[B][1]-152[B][3] are not writable, the fullavailable storage capacity is not currently available for writeoperations; only the P storage units 152[N][1]-152[N][P] in storagedivision 154N are available as write capacity for servicing writeoperations.

The storage layer 110 may be configured to write data out-of-place towritable storage units 152 in response to incoming storage requests. Thestorage layer 110 may service the write requests by a) writing data towritable storage units 152[N][1]-152[N][P] and b) mapping LIDsassociated with the data to the storage units 152 used to service thewrite requests, and so on. Servicing the write requests may consume theavailable write capacity of the storage medium 150 (e.g., fill storageunits 152[N][1]-152[N][P]). Write operations may stall when theremaining write capacity is exhausted.

Referring back to FIG. 1A, the storage layer 110 may comprise a mediamanager 130 configured to, inter alia, manage the available writecapacity on the storage medium 150. The media manager 130 may comprisean erase module 138 configured to transition storage divisions 154 to awritable state. The media manager 130 may further comprise an erasemanager 136 configured to reduce the erase dwell time of the storagedivision 154 and/or prevent write stall conditions. As disclosed above,erase dwell time refers to the time during which storage units 152 arein an erased, writable state. The erase dwell time of a storage unit 152may comprise the time span from erasure of the storage unit 152 untilthe time data is programmed to the storage unit 152.

The erase manager 136 may be configured to reduce the erase dwell timeof storage units 152 by, inter alia, scheduling erase operations onstorage divisions 154, such that the erase operations are completed atthe time the storage divisions 154 are projected to be required forservicing storage operations. Referring back to FIG. 1D, the erasemanager 136 may be configured to perform an erase operation on storagedivision 154A to increase the available write capacity on the storagemedium 150. In one embodiment, the erase operation may be implemented inresponse to selecting the storage division 154A for recovery (based onthe amount of invalid data in the storage division 154A) and/or inresponse to determining that the storage division 154A is prepared forerasure. As used herein, a storage division 154 that is prepared forerasure may refer to a storage division that does not comprise data thatneeds to be retained on the storage medium 150 (e.g., a storage division154 comprising invalid data and/or a storage division 154 from whichvalid data has been relocated). Erasing the storage division 154A inresponse to selection and/or determining that the storage division 154Ais prepared for erasure may, however, result in increased erase dwelltime for the storage division 154A. The storage division 154A may beheld in an erased state, while write operations are completed on otherwritabe storage divisions 152 on the storage medium 150 (e.g., storagedivisions 152[N][1]-152[N][P].

In some embodiments, the erase manager 136 is configured to adapt eraseoperations such that erase operation complete as the remaining writecapacity on the storage medium 150 is consumed. In the FIG. 1Dembodiment, the erase manager 136 may adapt the erase operation onstorage division 154A, such that storage division 154A transitions to awritable state at the time that the remaining write capacity of storagedivision 154N is filled. The erase manager 136 may configure the erasemodule 138 to initiate an erase operation on the storage division 154Ain response to filling a particular portion of storage division 154N(T_FillRatio), in response to filling a threshold number of storageunits 152 of the storage division 154N (T_Filled), in response todetermining that a threshold number of writable storage units 152 areavailable in the storage division 154N (T_Remain), and/or the like.

In some embodiments, the fill threshold(s) disclosed herein may be basedon a projected erase time for the storage division 154A-N to bereinitialized (e.g., ΔT_Erase of storage division 154A) and/or theprojected write and/or fill time for the storage division 154A-Ncurrently being used to service write requests (e.g., ΔT_Write ofstorage divisions 154N). The fill ratio threshold T_Ratio may becalculated as 1−(ΔT_Erase/ΔT_Write), such that the erase manager 136configures the erase module 138 to initiate erase of the storagedivision 154A when 1−(ΔT_Erase/ΔT_Write) of the write capacity withinthe storage division 154N has been filled. Other thresholds T_Filledand/or T_Remain may be derived by use of ΔT_Erase, ΔT_Write, and/ormetadata pertaining to the number of available storage units 152 withinthe storage division(s) 154A-N. The T_Filled threshold may be derivedfrom T_Ratio by scaling T_Ratio by the number of storage units 152 instorage division 154N.

In some embodiments, the ΔT_Erase and ΔT_Write may comprise fixed valuescorresponding to particular types of storage media, testing, experience,specifications, and/or the like. The projected erase time ΔT_Erase maycorrespond to measured, observed, and/or specified latencies for eraseoperations on the storage divisions 154A-N of the storage medium 150. Insome embodiments, the erase latency values (ΔT_Erase) are projected tobe the same across the storage divisions 154A-N and/or constant over thelife of the storage medium 150. Alternatively, the erase manager 136 mayadapt the ΔT_Erase values based on profiling metadata 129 pertaining toparticular storage divisions 154A-N, groups of storage divisions 154A-N,and/or usage conditions on the storage medium 150, such as the wearlevel(s) of the storage divisions 154A-N, past performance, and so on.In some embodiments, the projected erase latency ΔT_Erase increases as afunction of wear on the storage divisions 154A-N (e.g., may increase asa function of program erase count). The erase manager 136 may determinethe projected erase latency ΔT_Erase of storage divisions 154A-N basedon monitored erase performance (e.g., latency of erase operationspreviously implemented on the particular storage division 154A-N and/oron other storage divisions 154A-N). Performance characteristics of eraseoperations performed on the storage divisions 154A-N may be monitored bythe media controller 116 and/or recorded in the profiling metadata 129maintained by the storage layer 110, as disclosed herein. The erasemanager 136 may use the profiling metadata 129 to determine a projectederase latency for particular storage divisions 154A-N.

The projected ΔT_Write latency to fill a storage division 154A-N may bea fixed value corresponding to measured, observed, and/or specifiedlatencies for program and/or write operations on the storage medium 150.In one embodiment, the projected write time (ΔT_Write) of a storagedivision 154A-N may be projected based on the storage capacity of thestorage division 154A-N and/or the maximum write rate to the storagedivision 154A-N (e.g., the fill time for a storage division 154A-Nhaving a storage capacity of X MB and a maximum fill rate of Y MB/secondmay be X/Y seconds). In some embodiments, the ΔT_Write values areprojected to be the same across the storage divisions 154A-N.Alternatively, the ΔT_Write values may be adapted according to profilingmetadata 129 pertaining to particular storage divisions 154A-N and/orgroups of storage divisions 154A-N. In some embodiments, the projectedΔT_Write latency may be a function of operating conditions of thestorage medium, such as wear level (e.g., the ΔT_Write may increase as afunction of media wear). In some embodiments, ΔT_Write may be based onperformance of previous write operations on the particular storagedivision 154A-N and/or other storage divisions 154A-N. The performancecharacteristics of write operations may be monitored by the mediacontroller 116 and/or recorded in the profiling metadata 129, asdisclosed herein.

In some embodiments, the erase manager 136 is further configured toadapt erase operations in accordance with operating conditions, such asa projected write load. As used herein, the “write load” on the storagemedium 150 refers to the rate of incoming write requests to the storagelayer 110 and/or the amount of data to be written in response to thewrite requests (e.g., MB per second projected to be written to thestorage medium 150). The write rate may, therefore, affect the rate atwhich the write capacity of the storage medium 150 is consumed. Asdisclosed above, the projected write time (ΔT_Write) used to deriveT_Ratio, T_Filled, and/or T_Remain thresholds may correspond to theprojected time to fill a particular amount of write capacity under afull write load (e.g., minimum fill time assuming a full write load).If, however, the rate of write requests does not constitute a full writeload, write operations on the storage medium 150 may stall waiting forincoming write requests and the write capacity of the storage medium 150may be consumed at a lower rate than a maximum fill rate (e.g., theactual ΔT_Write may be significantly longer due to lower write rate).Accordingly, in some embodiments, the erase manager 136 may beconfigured to adapt the threshold(s) disclosed herein in accordance witha projected rate of write operations. In one embodiment, the erasemanager 136 may be configured to increase the projected write time(ΔT_Write) used to derive the threshold(s), disclosed above.Alternatively, the erase manager 136 may adapt the correspondingthresholds T_Ratio, T_Filled, and/or T_Remain based on projected writerate (e.g., increase the T_Ratio and/or T_Filled thresholds in responseto a low projected write rate and/or decrease the T_Remain threshold).Although particular mechanisms for determining threshold valuespertaining to erase operations are disclosed herein, the disclosure isnot limited in this regard, and could be adapted to use threshold valuesT_Ratio, T_Filled, and/or T_Remain derived using any suitable mechanism(e.g., and/or user-defined threshold values).

The erase manager 136 may be configured to determine a write loadprojection by, inter alia, monitoring write requests received throughthe interface 111, recording profiling metadata 129 pertaining to therate of write requests at particular times, and so on. The erase manager136 may be configured to determine a write rate projection by filteringa history of incoming write requests recorded in the profiling metadata129 in the time domain (e.g., using an exponential infinite impulseresponse (IIR) filter), and/or the like. Alternatively, or in addition,the erase manager 136 may utilize user-defined write rate projection(s).

In some embodiments, the erase manager 136 may be further configured toadapt erase operations in accordance with user-defined preferences. Theuser-defined preferences may specify whether to optimize the mediamanagement for write performance (e.g., to avoid write stallconditions), to optimize for media endurance (e.g., minimize erase dwelltime), and/or the like. Optimizing write performance may comprisereducing the T_Ratio and/or T_Filled thresholds (and/or increasing theT_Remain threshold) used to initiate erase operations on the storagedivisions 154A-N (e.g., by scaling one or more of ΔT_Write and/orΔT_Erase used to calculate the thresholds, and/or the like). Reducingthe T_Ratio and/or T_Filled thresholds (and/or increasing the T_Remainthreshold) may result in erasing storage divisions 154A-N sooner thanthe storage divisions 154A-N are projected to be needed to service writerequests, which may increase the erase dwell time of the storagedivisions 154A-N, but reduce the likelihood and/or frequency of writestall conditions. In another embodiment, user-defined preferences mayoptimize for media endurance, which may comprise increasing T_Ratioand/or T_Filled (and/or decreasing T_Remain), resulting in furtherdelays to the erase operations, which may minimize erase dwell time, butincrease the likelihood and/or frequency of write stall conditions.

As disclosed above, in the FIG. 1D embodiment, the storage manager 112may be preparing to write data to storage division 154N (the storagedivision 154N and the storage units 152[N][1]-152[N][P] thereof may bein a writable state). Accordingly, the storage division 154N may bedesignated as the “current” or “active” storage division 154A-N beingused to service write requests.

Referring back to FIG. 1A, the storage layer 110 may comprise a garbagecollector 132 configured to reclaim storage resources on the storagemedium 150. The garbage collector 132 may comprise a selector module 134configured to select storage divisions 154A-N for garbage collection(e.g., transition the storage division 154A-N from an unwritable stateto a writable state). A garbage collection operation may comprise: a)selecting a storage division 154A-N to reclaim, by use of the selectormodule 134), b) preparing the selected storage division 154A-N to bereset, and c) resetting the selected storage division 154A-N to awritable state (e.g., erasing the selected storage division 154A-N byuse of the erase manager 136 and/or erase module 138 as disclosedherein). Preparing the selected storage division 154A-N to be reset maycomprise relocating valid data stored on the selected storage division154A-N (if any) to one or more other storage divisions 154A-N.Alternatively, preparing the selected storage division to be reset maycomprise determining that the selected storage division 154A-N does notcomprise data that needs to be retained on the storage medium 150 (as inFIG. 1D, where the storage division 154A exclusively comprises invaliddata).

As disclosed herein, the selector module 134 may be configured to selecta storage division 154A-N for recovery by use of one or more selectionmetrics and/or criteria, which may include a primary selection metricand/or an alternative selection metric. The primary selection metric maycomprise a “free space” or “invalid data” metric. The “free space”metric of a storage division may quantify the amount of storage capacityfreed by recovering the respective storage divisions 154A-N (e.g., thefree space metric of a storage division 154A-N having 90% of itsphysical storage capacity in use to store invalid data may be expressedas a percentage, a ratio, 0.9*SD_Capacity, where SD_Capacity is thephysical storage capacity of the storage division, and/or the like). The“invalid data” metric may quantify the amount of invalid data storedwithin a storage division (e.g., 90% invalid). The metrics disclosedherein may be expressed in terms of percentages, ratios, physicalstorage capacity, and/or any other suitable mechanism.

The selector module 134 may use the free space and/or invalid dataselection metric to identify and/or select storage divisions 154A-Ncomprising relatively larger amounts of invalid data for garbagecollection. In some embodiments, recovering a storage division 154A-Nhaving a large amount of invalid data is preferred since garbagecollection operations on such storage divisions 154A-N result in: a)lower write amplification (less valid data to relocate from the selectedstorage division 154A-N); and b) increased available storage capacity.By contrast, recovering a storage division 154A-N comprising largeramounts of valid data may result in: a) increased write amplification(larger amount of valid data that must be rewritten to the storagemedium 150), and b) freeing a smaller amount of storage capacity.

As disclosed herein, the storage medium 150 may have a limited usablelife, which may be quantified in terms of the number of program and/orerase cycles that the storage divisions 154A-N are projected to becapable of enduring before becoming unusable. The storage layer 110 maybe configured to manage wear levels of the storage divisions so that thestorage divisions 154A-N wear evenly (e.g., prevent particular storagedivisions 154A-N from being used more heavily than other storagedivisions 154A-N, which may result in exhausting the usable life of theparticular storage divisions prematurely). Accordingly, as used herein,“wear leveling” refers to managing wear conditions on the storagemedium, such that wear is distributed evenly throughout the storageaddress space 151 of the storage medium 150 (e.g., distributed evenlyacross storage divisions 154A-N and/or the storage units 152 thereof).As used herein, a “wear condition” or “wear event” refers to anyoperation that consumes the usable life of a portion of the storagemedium 150, which may include, but are not limited to: program and/orwrite cycles, read operations, erase operations, reset operations,initialization operations, PE cycles, erase dwell, and/or the like. Themedia controller 116 may be configured to monitor wear conditions and/orwear events on the storage divisions 154A-N, and to record metadatapertaining to the wear levels and/or remaining life of the storagedivisions 154A-N in the profiling metadata 129. In some embodiments, theprofiling metadata 129 comprises metadata pertaining to the programerase count, erase dwell time, data retention time, error rate, writelatency, and/or erase latency of the storage divisions 154A-N.

The amount of wear on a storage division 154A-N may be quantified by useof a wear metric, which may correspond to one or more of: program and/orwrite cycle count, read operation count, erase cycle count, reset cyclecount, initialization cycle count, PE cycle count, erase dwell time,error rate, and/or the like. In some embodiments, storage divisions154A-N may be retired in response to the wear metric of the storagedivision exceeding a threshold. A remaining life metric may quantify theamount of remaining life of a storage division 154A-N, and maycorrespond to one or more of: remaining number of PE cycles the storagedivision is projected to be capable of enduring, projected error rate,and so on. The remaining life metric of a storage division may berelated to the wear metric of the storage division 154A-N (e.g., theremaining life metric of the storage division may be inverselyproportional to the wear metric of the storage division). The wearand/or remaining life metric of a storage division 154A-N may bedetermined by use of profiling information gathered and/or recorded inthe profiling metadata 129 maintained by the storage layer 110, asdisclosed herein.

In one embodiment, the selector module 134 is configured to adapt theprimary selection metric and/or criterion to distribute wear across thestorage divisions 154A-N of the storage medium 150, while reducing writeamplification. In one embodiment, the selector module modifies theinvalid data metric to calculate a granular invalid data metric (e.g.,granularize and/or quantize the amount of invalid data in the storagedivisions 154A-N). As used herein, a “granular invalid data metric”refers to a metric that quantifies the amount of invalid data in astorage division in terms of “granules” and/or “recovery blocks” (RB),which may represent a different quantum of storage capacity than theunderlying block size of the storage divisions 154A-N (e.g., may differfrom the physical storage capacity of the storage units within thestorage division, storage block size, packet size, and/or the like).Calculating a “granular invalid data metric” of a storage division154A-N may, therefore, comprise mapping the amount of invalid datastored within the storage division to a different, discrete set of RB,which may correspond to a particular percentage of the full storagedivision capacity. In one embodiment, a storage division may comprise 1K storage units, each having an 8 K physical storage capacity (e.g., thestorage division 154A-N may have a physical storage capacity of 8 MB).Accordingly, the “raw” or “full-resolution” invalid data metric for thestorage division may be defined in terms of the 8 K blocks. The RB maybe defined in terms of 64 K blocks. Therefore, the granular invalid datametric for a storage division in which 896 of the 8 K storage unitscomprise invalid data may be calculated as 112 recovery blocks (7168 Kof invalid data quantized to 64 K RBs). Invalid data values that do notmap directly within a discrete RB may be rounded up or down according toa quantization policy of the selector module 134. Although particularembodiments of granular metrics are described herein, the disclosure isnot limited in this regard, and could be adapted to determine granularmetrics using any suitable quantization, granularization, and/or datamapping technique.

The selector module 134 may select storage divisions 154A-N for recoveryby use of the granular invalid data metrics, disclosed above. Inaccordance with the primary, greedy algorithm, the selector module mayselect storage divisions 154A-N having higher granular invalid datametrics over storage divisions having lower granular invalid datametrics. The granular invalid data metrics disclosed herein may have alower resolution than the full-resolution, or raw invalid data metricsof the storage divisions 154A-N (e.g., the invalid data metrics of thestorage divisions 154A-N may be defined in terms of 8 K blocks, whereasthe granular invalid data metrics are defined in terms of larger, 64 KRB). Accordingly, storage divisions having similar, but not equal,amounts of invalid data may correspond to the same quantized invaliddata metric. In some embodiments, the selector module is configured toapply a secondary selection metric to select between two or more storagedivisions having the same quantized invalid data metrics (and/orquantized invalid data metrics within a threshold). The secondaryselection metric may be configured to wear level the storage medium 150and, as such, may correspond to wear metrics of the two or more storagedivisions 154A-N (e.g., may select the storage division having the lowerwear level and/or greater remaining life metric). In one embodiment, twostorage divisions 154A-N may comprise similar amounts of invalid data(e.g., 96.7% in storage division 154J and 97.1% in storage division154K). The granular invalidity metrics of the storage divisions 154J and154K may be the same. Therefore, in accordance with the secondaryselection metric, the selector module 134 may select the storagedivision 154J or storage division 154K having the lowest wear metric(e.g., fewest number of PE cycles) for garbage collection. The storagedivision 154J may have a lower wear metric than the storage division154K and, as such, may be selected for garbage collection even throughthe raw invalid data metric of the storage division 154J is less optimalthan storage division 154K (96.7% invalid versus 97.1% invalid).Alternatively, or in addition, the secondary selection metric maycorrespond to data retention time, such that the storage division 154Jor 154K with the longest time data retention is selected for recovery.As used herein, the “data retention time” of a storage division refersto the length of time data has remained on the storage division. Thedata retention time of a storage division may refer to the time that haselapsed since the storage division was closed (e.g., since the storageunits thereof were programmed). Alternatively, the data retention timemay be defined as the time elapsed since the storage division wasinitialized and/or since data was first programmed to the storagedivision after initialization (e.g., time elapsed since the storagedivision was erased, reset, recovered, cleared, and/or the like).

In some embodiments, the selector module is further configured toimplement an adaptive comparison of invalid data metrics pertaining tothe storage units (either the raw invalid data metric and/or thegranular invalid data metrics). As used herein, an adaptive comparisonrefers to a comparison and/or selection criterion that is a function ofthe relative amounts of invalid data within the storage divisions. In anadaptive comparison, the selector module 134 may be configured to adjustthe resolution and/or weight of differences in invalid data metrics inaccordance with the relative amount of invalid data within the storagedivisions 154A-N. In one embodiment, the adaptive comparison isconfigured to reduce the weight of differences in the invalid datametrics when comparing storage divisions 154A-N comprising relativelylarge amounts of invalid data (since small differences in the overallamount of invalid data in the respective storage divisions 154A-N areunlikely to significantly affect write amplification). By contrast,differences in the invalid data metrics in comparisons between storagedivisions 154A-N comprising smaller amounts of invalid data may beweighted more heavily (since recovery of such storage divisions islikely to create significantly more write amplification). In oneembodiment, the adaptive comparison implemented by the selector module134 comprises a logarithmic comparison of the invalid data metrics ofthe storage divisions (e.g., the approximate base 2 log of the rawand/or granular invalid data metrics of the storage divisions 154A-N)and/or may comprise deriving adaptive invalid data metrics correspondingto the storage divisions 154A-N. Storage divisions 154A-N having similaradaptive invalid data metrics (and/or within a threshold) may bedistinguished by use of a secondary selection metric, as disclosed above(e.g., based on wear metric, data retention time, and/or the like).Although particular embodiments of adaptive metrics and/or comparisonsare described herein, the disclosure is not limited in this regard andcould be adapted to implement an adaptive comparison of invalid datametrics (raw and/or granular) using any suitable technique.

In some embodiments, the selector module 134 is further configured tooverride the primary selection metric and/or criterion with analternative selection metric and/or criterion. The alternative selectionmetric may be adapted to wear level the storage medium 150, such thatstorage divisions 154A-N having lower levels of wear are selected forgarbage collection over storage divisions 154A-N having higher levels ofwear, despite differences in the amount of invalid data on therespective storage divisions 154A-N. The alternative selection metricmay prevent storage divisions 154A-N comprising “cold” and/orwrite-once-read-many (WORM) data from disuse and/or avoid concentrationof PE cycles in certain storage divisions 154A-N. Overriding the primaryselection metric may comprise selecting a storage division 154A-N torecover based on wear and/or remaining life metrics of the storagedivisions 154A-N as opposed to the invalid data metrics disclosed above.Storage divisions selected using a wear level selection metric mayresult in increased write amplification (and/or free less storagecapacity than a recovery operation on a storage division comprising alarger amount of invalid data). Accordingly, the selector module 134 maylimit overrides of the primary selection metric. The selector module 134may be configured to override the primary selection metric with thealternative selection metric in response to wear level conditions on thestorage medium 150. In one embodiment, the selector module is configuredto override the primary selection metric in response to determining thatthe wear is not being evenly distributed among the storage divisions154A-N (e.g., based on differences in wear metrics between the storagedivisions 154A-N). In one embodiment, the selector module 134 isconfigured to override the primary selection metric in response to adifference between the wear level and/or remaining life metric of one ormore storage divisions 154A-N exceeding a threshold. Alternatively, orin addition, the selector module 134 may be configured to override theprimary selection metric in response to a variance and/or deviation inthe wear metrics of the storage divisions 154A-N exceeding a threshold.In some embodiments, the selector module may further limit overrides ofthe primary selection metric to a particular period and/or frequency(e.g., an override per N selections using the primary selection metric).

The selector module 134 may be configured to select storage divisionsfor garbage collection and/or recovery in response to particularconditions, such as the availability of write capacity on the storagemedium 150. As disclosed above, the write capacity on the storage medium150 refers to the availability of writable storage units 152 and/orstorage divisions 154A-N. The storage manager 112 may be configured toservice write requests by, inter alia, writing data to writable storageunits 152, thereby consuming the write capacity on the storage medium150. In one embodiment, the storage manager 112 comprises write capacitymetadata 113, which may comprise a write capacity queue. The writecapacity queue may track and/or identify writable storage resources onthe storage medium 150 (e.g., available write capacity). In the FIG. 1Dembodiment, the write capacity metadata 113 indicates that the storageunits 152 of storage division 154N are available to service writerequests (e.g., are writable). The write capacity metadata 113 mayfurther include other storage divisions 154A-N and/or storage units 152that are in a writable state (not shown). The write capacity metadata113 may comprise a pointer 160 to the storage address that is currentlyin use for servicing write requests. The pointer 160 may reference astorage unit 152 that will be used to service the next write requestreceived at the storage layer 110. The pointer 160 may constitute acurrent append point within the storage address space 151. The storagemanager 112 may be further configured to determine and/or trackavailable write capacity metadata 161 that indicates the remainingavailable write capacity on the storage medium 150. In the FIG. 1Dembodiment, the available write capacity metadata 161 may indicate thatthe storage medium 150 comprises P storage units 152 of write capacity.

In some embodiments, the storage manager 112 is configured to fillstorage divisions 154A-N according to a particular fill pattern (e.g.,sequentially within the storage address space 151 of the respectivestorage divisions 154A-N). Accordingly, the storage manager 112 mayservice a next write request by writing data to storage unit 152[N][1]and, in response, may increment the pointer 160 to storage unit152[N][2], and so on. After filling a storage division 154A-N, thestorage manager 112 may begin writing to another writable storagedivision 154A-N (if available). If no writable storage units 152 areavailable, the storage manager 112 may stall write operations untiladditional write capacity is reclaimed, as disclosed herein. Although inFIG. 1A the write capacity queue is depicted as an element of thestorage manager 112, the disclosure is not limited in this regard, andmay be adapted to maintain the write capacity metadata 113 with otherstorage metadata 124, such as the forward map 125, validity map 127,profiling metadata 129, and/or the like.

As disclosed above, the selector module 134 is configured to identifystorage divisions 154A-N for garbage collection using, inter alia, aprimary selection metric and/or criterion, an alternative selectionmetric and/or criterion, and/or one or more secondary selection metricsand/or criteria. The selector module 134 may maintain metadatapertaining to storage divisions that are suitable for garbage collectionby use of garbage collection metadata 133, which may be maintained bythe storage layer 110 with the storage metadata 124, as disclosedherein. Referring to FIG. 1D, the garbage collection metadata 133 mayinclude a primary selection queue 137A that identifies storage divisions154A-N selected for storage recovery by use of a primary selectionmetric and/or criterion. As disclosed herein, the primary selectionmetric may correspond to a greedy selection metric based on one or moreof: an invalid data metric (e.g., amount of invalid data stored withinthe respective storage divisions 154A-N), a granular invalid datametric, an adaptive invalid data metric (e.g., adaptive and/orlogarithmic invalid data metric), and/or the like. In the FIG. 1Dembodiment, the storage division 154A may correspond to the highestinvalid data metric and, as such, is in the primary selection queue137A. Other storage divisions 154A-N comprising similar and/orequivalent invalid data metrics may be included in the primary selectionqueue 137A. In some embodiments, the primary selection queue 137Acomprises a list of storage divisions 154A-N ordered by respectiveinvalid data metrics thereof. Alternatively, or in addition, the primaryselection queue 137A may comprise a plurality of regions and/orclassifications comprising storage divisions 154A-N having similarand/or equivalent invalid data metrics (e.g., storage divisions havingraw, granular, and/or adaptive invalid data metrics that differ by lessthan a threshold). As disclosed herein, the selector module 134 mayselect storage divisions 154A-N form the respective regions and/orclassifications based on one or more secondary selection metrics (e.g.,wear metric and/or data retention time).

In some embodiments, the garbage collection metadata 133 furtherincludes an alternative queue 137B that identifies storage divisions154A-N for garbage collection selected by use of an alternativeselection metric and/or criterion (e.g., wear and/or remaining lifemetric). The alternative queue 137B may, therefore, comprise storagedivisions 154A-N having lower wear metrics than other storage divisions154A-N. In the FIG. 1D embodiment, the storage division 154B may havelower than normal wear and, as such, is selected for inclusion in thealternative queue 137B. The garbage collection metadata 133 may furtherinclude and/or reference wear level metadata pertaining to the storagedivisions 154A-N. The wear level metadata 139 may be maintained in theprofiling metadata 129, as disclosed above. The wear level metadata mayindicate the relative wear metrics of the storage divisions 154A-N,including differences between wear levels of the storage divisions154A-N. The selector module 134 may access the wear level metadata 139to determine whether to override the primary selection metric with thealternative selection metric. In the FIG. 1D embodiment, overriding theprimary selection metric may comprise selecting storage division 154Bfrom the alternative queue 137B for a garbage collection operationrather than storage division 154A in the primary queue 137A.

As disclosed above, the selector module 134 may be configured todetermine whether to override the primary selection metric in responseto a difference in wear metrics between two or more storage divisions154A-N exceeding a threshold. In one embodiment, the difference in wearmetric may be quantified as a difference in erase count. The selectormodule 134 may override the primary selection metric in response to adifference between the highest PE count (PE_High) and a low PE count(PE_Low) exceeding a difference threshold (T_PECount), such thatPE_High−PE_Low≥T_PECount. In another embodiment, the selector module 134may be configured to override the primary selection metric in responseto a difference between a PE count of a particular storage division(e.g., the PE count of storage division 154B, PE_CountB) and an averagePE count of the storage divisions 154A-N (PE_Ave) exceeds a threshold(T_PEAve), such that |PE_Ave−PE_CountB|≥T_PEAve. In another embodiment,the selector module 134 may maintain a mathematical model of thedistribution of wear metrics (e.g., a normal or Gaussian distribution).The selector module 134 may override the primary selection metric inresponse to a variance and/or deviation of the model exceeding athreshold. Although particular metrics and/or criteria for overridingthe primary selection metric are described herein, the disclosure is notlimited in this regard, and could be adapted to determine whether tooverride the primary selection metric with a wear-based metric by use ofany suitable metric and/or criterion. Moreover, although the specificexamples disclosed herein pertain to PE count, the disclosure is notlimited in this regard and may be adapted to quantify wear metric and/ordifferences in wear metrics using any suitable measure of media wear,including, but not limited to: erase dwell time, error rate, projectederror rate, and/or the like.

As disclosed above, a garbage collection operation may comprise a)preparing a selected storage division 154A-N to be erased and/or b)erasing the selected storage division 154A-N by use of the erase manager136 and/or erase module 138. Preparing the selected storage division154A-N to be erased may comprise determining that data stored on thestorage division 154A does not need to be retained on the storage medium150 (e.g., the data is invalid).

FIG. 1E depicts embodiments for minimizing erase dwell of a storagemedium 150. In the FIG. 1E embodiment, the storage division 154A isselected for recovery. In the FIG. 1E embodiment, the garbage collectionmetadata 133 comprises a reset queue 135 that identifies storagedivisions 154A-N that are prepared to be reset (e.g., erased to awritable state). As disclosed herein, a storage division 154A-N isprepared to be reset in response to determining that the storagedivision does not comprise data to retain on the storage medium 150. Thestorage division 154A does not comprise data to retain on the storagemedium 150 and, as such, may be included in the reset queue 135.Although not depicted in FIG. 1E, one or more other storage divisions154A-N may be included in the primary selection queue 137A based on,inter alia, invalidity metrics of the storage divisions 154A-N, asdisclosed herein.

The erase manager 136 may be configured to transition the storagedivision 154A to a writable state, such that the erase dwell time of thestorage division 154A is minimized. The erase manager 136 may configurethe erase operation on the storage division 154A, such that the eraseoperation is projected to complete at the time the storage division 154Awill be needed to service write requests. The erase manager 136 maydelay the erase operation in response to selection of the storagedivision 154A for garbage collection and/or in response to determiningthat the storage division 154A is prepared to be erased (e.g., inresponse to placing the storage division 154A in the reset queue 135).

As disclosed above, the erase manager 136 may be configured to delay theerase operation until a threshold ratio of the write capacity of storagedivision 154N is consumed (T_Ratio), until a threshold number of storageunits 152 of the storage division 154N are filled (T_Filled), and/or theremaining write capacity of the storage division 154N (and/or otherwritable storage divisions 154A-N) falls below a threshold (T_Remain).The delay period may be based on the projected write time to the currentstorage division (storage division 154N), which may include writelatency of the storage division 154N and/or a projected rate of writeoperations performed on the storage division 154N and/or a projectederase latency of the storage division 154A. In the FIG. 1E embodiment,the erase manager 136 is configured to initiate the erase operation onthe storage division 154A in response to filling Q storage units 152 ofthe storage division 154N (the T_Filled threshold may be Q storageunits, which may be determined as disclosed herein). As illustrated inFIG. 1E, write capacity metadata 113 indicates that the pointer 160 hasadvanced within the storage address space 151 of the storage division154N, and the write capacity metadata 161 indicates that the remainingwrite capacity on the storage medium comprises P-Q storage units 152. Asfurther illustrated in FIG. 1E, the storage division 154A is being heldin a non-erased state, such that the erase operation on the storagedivision 154A has been delayed and/or deferred by the erase manager 136in order to, inter alia, reduce the erase dwell time of the storagedivision 154A. In response to the write capacity metadata 113 depictedin FIG. 1E, the erase manager 136 may initiate an erase operation on thestorage division 154A.

FIG. 1F depicts one embodiment of a storage recovery operation on astorage medium 150. FIG. 1F depicts a recovery operation on the storagedivision 154A. The recovery operation may comprise erasing the storagedivision 154A. The erase operation may have a latency (ΔT_Erase). Asillustrated in FIG. 1F, during the erase operation on storage division154A, the storage manager 112 may continue to service storage requestsby, inter alia, writing data to the storage division 154N. The storagemanager 112 may have filled P−1 storage units 152 within the storagedivision 154N, such that a single writable storage unit 152[N][P]remains. The pointer 160 of the write capacity metadata 113 may,therefore, reference storage unit 152[N][P].

The erase operation on storage division 154A may have generatedadditional write capacity (e.g., P storage units 152[A][1]-152[A][P]).Accordingly, the write capacity metadata 161 may indicate an availablewrite capacity of P+1 storage units 152. The write capacity metadata 113(in a write capacity queue) may include the storage division 154A, suchthat, after writing data to the storage unit 152[N][P], the pointer 160may advance to storage unit 152[A][1], or other writable storage unit152 within storage division 154A.

As shown in FIG. 1F, data stored in the storage division 154B may havebeen invalidated during the erase operation on storage division 154A.The data may have been invalidated due to being overwritten and/orupdated out-of-place (e.g., on storage division 154N), being deleted,erased, TRIMed, and/or the like. Accordingly, the storage units152[B][1]-152[B][M] comprise invalid data, and the storage units152[B][M+1]-152[B][P] comprise valid data. FIG. 1F further illustratesstorage division 154C, which may be filled with invalid data (asindicated by the validity bitmap 128C).

The selector module 134 may select another storage division 154A-N forrecovery based on one or more of the primary selection metric and/oralternative selection metric, disclosed herein. In the FIG. 1Fembodiment, the primary selection queue 137A comprises, inter alia,storage division 154C, and the alternative selection queue 137Bcomprises storage division 154B. The selector module 134 may determinewhich selection metric to use in selecting a next storage division154A-N to recover based on the wear metadata 139. As disclosed above,the selector module 134 may override the primary selection metric withthe alternative selection metric in response to wear level conditions onthe storage medium (e.g., variance wear metrics of the storage divisions154A-N). In the FIG. 1F embodiment, the selector module 134 isconfigured to model a distribution of wear metrics of the storagedivision 154A-N by use of a distribution model (e.g., normaldistribution). The selector module 134 may be configured to override theprimary selection metric in response to a deviation of the modelexceeding a deviation threshold. Alternatively, the selector module maybe configured to override the storage medium in response to a differencebetween wear metrics of one or more of the storage divisions 154A-Nexceeding a threshold, a variance exceeding a threshold, and/or thelike, as disclosed above. In the FIG. 1F embodiment, the selector module134 may determine that the wear distribution exceeds the deviationthreshold and, as such, may override the primary selection metric withthe alternative selection metric.

Overriding the primary selection metric may comprise selecting thestorage division 154B from the alternative queue 137B rather thanstorage division 154C in the primary queue 137A. In response toselecting the storage division 154B for garbage collection, the erasemanager 136 may prepare the storage division 154B to be erased, whichmay comprise relocating valid data from the storage division 154B (ifany) to one or more other storage divisions 154A-N. In the FIG. 1Fembodiment, the storage division 154B may be prepared for recovery by,inter alia, rewriting the data stored in storage units152[B][M+1]-152[B][P].

FIG. 1G depicts operations to prepare the storage division 154B to bereset to a writable state. The storage division 154C is omitted fromFIG. 1G to avoid obscuring the details of the depicted embodiments. Asillustrated in FIG. 1G, the data of storage units 152[B][M+1]-152[B][P]may be relocated to the remaining write capacity available in storagedivision 154N (storage unit 152[N][P]) and to storage division 154A(e.g., storage units 152[A][1]-152[A][L]). The data may be relocated byuse of a relocation module of the erase manager 136 by, inter alia,rewriting the data to the storage medium and/or updating associationsbetween LIDs of the data and the physical storage addresses of therewritten data. Accordingly, relocating valid data from the storagedivision 154B may consume a portion of the write capacity of the storagemedium 150 (e.g., incur a write amplification penalty due to rewritingthe valid data on the storage medium 150). After relocating the datafrom storage division 154B, and assuming no intervening write requestsare performed, the remaining write capacity may comprise P-L storagedivision 154. In response to relocating valid data from storage division154B, the existing data in the storage division 154B may be marked asinvalid (since the data has been rewritten to other portions of thestorage medium 150). The erase manager 136 may, therefore, determinethat the storage division 154B is prepared to be erased and may move thestorage division 154B into a reset queue 135.

As disclosed above, the erase manager 136 may adapt the reset operationon the storage division 154B to minimize the erase dwell time of thestorage division 154B. Accordingly, the erase manager 136 may delay theinitiation of the erase operation on the storage division 154B for adelay period and/or until a write capacity threshold is satisfied.Satisfying the write capacity threshold may comprise determining thatthe available write capacity on the storage medium 150 is less than orequal to a particular threshold value. Alternatively, or in addition,the delay period may be based on projected fill time of the remainingwrite capacity (ΔT_Fill of storage division 154A), projected write rate,projected erase latency of storage division 154B, and/or the like.

After the erase delay period and/or in response to determining that thewrite capacity threshold is satisfied, the erase manager 136 may erasethe storage division 154B by use of the erase module 138. Erasing thestorage division 154B may comprise transitioning the storage units152[B][1]-152[B][P] to a writable state, adding the storage division154B to the write capacity metadata 113 (e.g., in a write queue),updating the write capacity metadata 161 (e.g., to 2P−L, assuming nointervening storage requests), and so on, as disclosed herein.

In some embodiments, the erase manager 136 may be further configured toreduce erase dwell time by, inter alia, erasing portions of storagedivisions 154A-N in stages. As disclosed above in conjunction with FIG.1B, a storage division 154A-N may comprise a plurality of physical eraseblocks on different respective storage elements 156A-Y. In oneembodiment, the erase manager 136 is configured to erase regions of astorage division 154A-N as the regions are needed to service storagerequests. Erasing a region of a storage division 154A-N may compriseerasing a subset of the physical erase blocks comprising the storagedivision 154A-N. Write operations may continue within erased portions ofthe storage division 154A-N, and other regions may be erased asadditional write capacity is required.

FIG. 2A is a schematic block diagram of one embodiment 201 of a storagemodule 210 configured to provide storage services to clients 107 by useof a storage medium 150. The storage module 210 may comprise hardwareand/or software components, as disclosed herein. In some embodiments,the storage module 210 comprises and/or is configured for operation on acomputing system 100, as disclosed herein.

The storage module 210 may comprise a log storage module 150 configuredto, inter alia, leverage the logical-to-physical translation layerimplemented by the translation module 120 to maintain a storage log 241within the storage address space 151 of the storage medium 150. The logstorage module 140 may be configured to store data in within a “storagelog,” and/or in a “log structured format” or “log format.” As usedherein, a “storage log” and/or “log structured format” refers to anordered arrangement of log entries stored within the storage addressspace 151. As disclosed above, data stored in a storage log may compriseand/or be associated with persistent, crash safe metadata that isconfigured to, inter alia, identify the data (e.g., indicate a contextof the stored data). The persistent, crash safe metadata may include anysuitable information pertaining to the stored data, including, but notlimited to: translation metadata (e.g., logical-to-physical translationmetadata), the logical interface of data in the storage log (e.g., LIDsassociated with the data), modifications to logical-to-physicaltranslations, information pertaining to the owner of the data, accesscontrols, data type, relative position or offset of the data withinanother data structure (e.g., an object), information pertaining tostorage operation(s) associated with the data (e.g., atomic storageoperations, transactions, and/or the like), sequence information, datastorage parameters (e.g., compression algorithm, encryption, etc.),and/or the like.

FIG. 2B illustrates embodiments of storage log entries 242, including adata storage log entry (data packet 245), a metadata entry 248, and logsequence metadata (e.g., sequence information 249). The data packet 245may comprise a data block 246 and persistent metadata 247. The datablock 246 may be of any arbitrary length and/or size. The persistentmetadata 247 may be embodied as one or more header fields of the datapacket 245. The persistent metadata 247 of the data packet 245 maycomprise a metadata entry pertaining to the data block 246. Thepersistent metadata 247 may comprise the logical interface of the datablock 246, such as the LID(s) associated with the data block 246 (e.g.,LID A, VID Z, and/or the like) and/or other identifiers associated withthe data block 246 (e.g., intermediate and/or virtual identifier Y).Although FIG. 2B depicts a particular embodiment of a data packet 245,the disclosure is not limited in this regard and could associate data(e.g., data block 246) with persistent, crash safe metadata in otherways including, but not limited to: an index on the storage medium 150(and/or other storage device), a storage division index, a separatemetadata log, a metadata entry 248, and/or the like. Accordingly, insome embodiments, the data entries 245 may be associated with separatemetadata entries 248 (described in further detail below) and, as such,may not include a persistent metadata header 247.

FIG. 2B further depicts embodiments of a metadata entry 248. Asdisclosed above, a metadata entry refers to an entry in the storage logcomprising persistent, crash safe metadata pertaining to the storagelog. A metadata entry 248 may include but is not limited to: translationmetadata (e.g., logical-to-physical translation metadata), the logicalinterface of data in the storage log (e.g., LIDs associated with thedata), modifications to logical-to-physical translations, informationpertaining to the owner of the data, access controls, data type,relative position or offset of the data within another data structure(e.g., an object), information pertaining to storage operation(s)associated with the data (e.g., atomic storage operations, transactions,and/or the like), log sequence information, data storage parameters(e.g., compression algorithm, encryption, etc.), and/or the like. Asillustrated in FIG. 2B, the metadata entry 248 may comprise: a)logical-to-physical mapping information that associates LID(s) with datastored in the log (and/or modifies existing logical-to-physical mappings(e.g., maps LID A to storage address Y, {LID A, Storage Addr Y}), andmay comprise logical-to-virtual mapping information that associates LIDswith particular intermediate and/or virtual identifiers (e.g., maps LIDA to VID Z, {LID A, VID Z}), indicates that LID A is empty, deleted,unmapped, TRIMed, {LID A, Empty}), indicates that LID A corresponds todata that is unreadable and/or corrupt {LID A, Corrupt}, and/or thelike.

The log entries 242 disclosed herein may be associated with log sequencemetadata that defines, inter alia, the relative order of the log entries242 within the storage log (e.g., sequence information 249). Thesequence information 249 of FIG. 2B may be used to determine therelative log order of storage divisions 154 comprising a storage log. Insome embodiments, the log storage module 140 appends log entries 242sequentially within storage divisions 154A-N of the storage medium 150.Each storage division 154A-N may be capable of storing a large number ofdata packets (e.g., may comprise a plurality of storage units 152).Storage divisions 154A-N may be assigned sequence information 249 at thetime the storage divisions 154A-N are initialized for use (e.g.,erased), programmed, closed, and/or the like. The sequence information249 may determine the log order of the storage divisions 154A-N (e.g.,order in which data was appended within the respective storage divisions154A-N). Accordingly, the log order of an entry 242 in the storage logmay be determined by: a) the relative position of the entry 242 within aparticular storage division 154A-N, and b) the log order of the storagedivision 154A-N as determined by the corresponding sequence information249.

FIG. 2C depicts one embodiment of a storage log 241. The storage log 241may comprise a plurality of log entries 242 stored sequentially withinthe storage address space 151 of the storage medium 150. As disclosedabove, the log order 243 of the entries 242 may be determined based ona) the offset of the entries 242 within the respective storage divisions154A-N and b) the sequence information 249 associated with the storagedivisions 154A-N.

The log storage module 140 may be configured to append log entries 242sequentially within the storage address space 151 (e.g., within storagedivisions 154A-N), by use of, inter alia, the media controller 116. Thelog storage module 140 may be configured to fill respective storagedivisions 154A-N before appending data to other storage divisions154A-N. The order in which data is appended within the respectivestorage divisions 154A-N may be determined according to the availabilityof erased and/or initialized storage divisions 154A-N (e.g., a writecapacity metadata 113 of the log storage module 140, as disclosedherein).

In the FIG. 2C embodiment, the log storage module 140 may have storedentries 242[A][1]-242[A][P] sequentially within storage division 154A,such that log entry 242[A][P] is ordered later in the storage log 241(stored more recently) relative to data packet 242[A][1]. FIG. 2Cfurther illustrates entries 242 stored sequentially within other storagedivisions 154B-N: entries 242[B][1]-242[B][P] are stored sequentiallywithin storage division 154B, log entries 242[C][1]-242[C][P] are storedsequentially within storage division 154C, data packets242[N][1]-242[N][P] are stored sequentially within storage division154N, and so on. The storage division 154D may comprise invalid dataand, as such, may not comprise valid stored log entries 242 nor beassigned sequence information 249.

As disclosed above, the log storage module 140 may mark storagedivisions 154A-N with respective sequence information 249[1]-249[Y] thatdefines the order in which data was programmed to the storage divisions154A-N. Accordingly, the log order 243 of the entries242[A][1]-242[N][M] may be defined by, inter alia, the sequenceinformation 249[1]-249[Y] assigned to the respective storage divisions154A-N. In some embodiments, sequence information 249 is stored at apredetermined location within the respective storage divisions 154A-N(e.g., in a header, at a predetermined offset, and/or the like).Alternatively, sequence information 249 pertaining to the storagedivisions 154A-N may be stored at a designated storage address. Thesequence information 249[1]-249[Y] may be stored on the storagedivisions 154A-N during initialization: when selected for use by the logstorage module 140, and/or placed in a write capacity queue (maintainedin the write capacity metadata 113); when data is appended to thestorage divisions 154A-N; when the storage divisions 154A-N are closed;and/or the like.

In the FIG. 2C embodiment, the sequence information 249[Y] maycorrespond to the most recent (youngest) storage division 154A-N withinthe storage log 241, and the sequence information 249[1] may correspondto the earliest (oldest) storage division 154A-N within the storage log241. Therefore, and as illustrated in FIG. 2C, the log order 243 of thestorage divisions 154A-N may be: 154N (most recent), 154A, 154C, and154B (oldest). The order of the individual entries 242[A][1]-242[N][M]within the storage log 241 may be determined based on the sequenceinformation 249 of the storage divisions 154A-N and the relative storageaddresses of the entries 242[A][1]-242[N][M] within the respectivestorage divisions 154A-N. In the FIG. 2C embodiment, the log order 243from most recent (head 261 of the storage log 241) to oldest (tail 263of the storage log 241) is: 242[N][M]-242[N][1], 242[A][P]-242[A][A],242[C][P]-242[C][1], and 242[B][P]-242[B][1].

The log storage module 140 may be configured to append entries 242sequentially at an append point 260 within the storage log 241 (at thehead 261 of the storage log 241). The append point 260 may address awritable storage unit 152 within a storage division 154A-N, as disclosedabove. The log storage module 140 may advance the append point 260sequentially within the storage address space 151 of the respectivestorage divisions 154A-N (e.g., from storage address 0 to storageaddress N of the respective storage divisions 154A-N). The disclosure isnot limited in this regard, however, and could be adapted to advance theappend point according to any sequence and/or pattern (e.g., fromstorage address N to 0, according to a particular fill pattern, and/orthe like). After filling (and/or substantially filling) the storagedivision 154N, the log storage module 140 may advance the append point260 to a next available storage division 154A-N. As disclosed herein, anavailable storage division refers to a storage division that is in awriteable state (has been initialized).

As disclosed above, the storage module 210 may comprise a garbagecollector 132 to perform garbage collection operations on the storagedivisions 154A-N, which may comprise initializing storage divisions154A-N and/or making the storage divisions 154A-N available to the logstorage module 140 to store new log entries 242, as disclosed herein.The garbage collector 132 may be configured to select storage divisions154A-N for recovery by use of a primary selection metric and/or one moresecondary selection metrics. The selector module may be furtherconfigured to override the primary selection metric with an alternativeselection metric under certain conditions (e.g., in response to a wearmetric variance of the storage divisions 154A-N exceeding a threshold).The selector module 134 may identify storage divisions 154A-N comprisingaged data (e.g., having high data retention times) based on the logorder 243 of the storage log. In some embodiments, the selector module134 evaluates storage divisions 154A-N for recovery from the log tail263 towards the log head 261. The primary selection metric for selectingstorage divisions to recover, however, may be based on invalid datametrics of the storage divisions 154A-N as opposed to data retentiontime, which, as disclosed above, may be used as a secondary selectionmetric.

As disclosed above, the log module 140 may be configured to append dataat the current log append point 260. In the FIG. 2C embodiment, theappend point 260 references storage division 154N. The log storagemodule 140 may maintain a write capacity queue (e.g., in the writecapacity metadata 113), as disclosed above, which may indicate thecurrent append point 260 and/or identify other available write capacityon the storage medium 150 (e.g., in write capacity metadata 161). Asillustrated, the available write capacity on the storage medium 150 maybe limited to the storage division 154N. Referring to FIG. 2A, the logstorage module 140 may request additional write capacity from the mediamanager 130, which may generate additional write capacity by a)selecting a storage division 154A-N for recovery, by use of the selectormodule 134, b) preparing the selected storage division 154A-N to beerased, and c) erasing the selected storage division 154A-N, asdisclosed herein. Storage divisions 154A-N selected for recovery may beinitialized by the initialization module 236. The initialization module236 may be configured to prepare storage divisions 154A-N to be resetby, inter alia, relocating valid data on the selected storage divisions154A-N by use of the relocation module 238. Relocating valid data from astorage division 154A-N may comprise appending the data at the head ofthe storage log 241 (e.g., at the current append point 260). Theinitialization module 236 may be further configured to delay, schedule,and/or trigger erase operations on storage divisions 154A-N to minimizethe erase dwell time of the storage divisions 154A-N. Minimizing erasedwell time may comprise delaying, scheduling, and/or triggering eraseoperations, such that the operations complete at the time thecorresponding storage division 154A-N is needed for use (e.g., is neededto append additional entries to the storage log 241).

In the FIG. 2C embodiment, the selector module 134 may select storagedivision 154D for recovery. The initialization module 236 may determinethat the storage division 154D is prepared to be erased (e.g., does notcomprise valid data to retain on the storage medium 150). Theinitialization module 236 may delay the reset operation on the storagedivision 154D for an erase delay period and/or until a write capacitythreshold is satisfied. In some embodiments, the initialization module236 is configured to initiate a reset operation on the storage division154D in response to filling a threshold amount of the storage division154A-N comprising the append point 260 of the storage log 241 (e.g.,storage division 154N). The fill threshold (T_Filled) may be based on aprojected write latency of the storage division 154N, write rate to thestorage division 154N, erase latency of the storage division 154D, andso on, as disclosed herein. Alternatively, or in addition, theinitialization module 236 may be configured to initiate erasure of thestorage division 154D in response to filling a threshold portion and/orratio of the available write capacity on the storage medium 150 (e.g.,T_FillRatio) and/or determining that a threshold amount of writecapacity remains available on the storage medium 150.

As disclosed above, in some embodiments, the initialization module 236may be configured to optimize recovery operations to minimize thelikelihood of write stalls, which may comprise increasing the T_Remainthreshold and/or maintaining one or more writable storage divisions154A-N in an available write pool. In FIG. 2C, the initialization module236 may be configured to maintain a reserve storage division 154A-N inaddition to the write capacity remaining in storage division 154N (e.g.,storage division 154X). The available write capacity may, therefore,comprise the write capacity of storage division 154N and the writecapacity of storage division 154X. The initialization module 236 may beconfigured to erase storage division 154D when the overall writecapacity of storage division 154N and 154X fall below a threshold(T_Remain). Alternatively, or in addition, the initialization module 236may be configured to initiate the erase operation on storage division154D, such that the operation is projected to complete at the time datais written to the reserve storage division 154X (e.g., ensureavailability of one or more writable storage divisions 154A-N). Inanother embodiment, the initialization module 236 is configured to erasethe storage division 154D in response to appending data to fillingstorage division 154N, advancing the append point 260 to storagedivision 154X, and/or writing a log entry 242 to storage division 154X.

FIG. 3 is a flow diagram of one embodiment of a method for managingstorage erase operations. Step 310 may comprise writing data to a firststorage division 154A-N of a solid-state storage medium 150. Thesolid-state storage medium 150 may have write-once properties, asdisclosed herein. Step 310 may comprise writing data at pointer 160within the first storage division 154A-N. Alternatively, step 310 maycomprise appending data to a storage log 241 at an append point 260within the first storage division 154A-N.

Step 320 may comprise initiating an erase operation on a second storagedivision 154A-N in response to filling a threshold number of storageunits 152 and/or available write capacity within the first storagedivision 154A-N. Step 320 may further include selecting the secondstorage division 154A-N for recovery by use of the selector module 134,as disclosed herein. In some embodiments, step 320 further includesdetermining the threshold number of storage units 152 based on one ormore of a write latency for the first storage division 154A-N, aprojected write rate, and/or a projected erase latency for the secondstorage division 154A-N, as disclosed herein.

FIG. 4 is a flow diagram of one embodiment of a method for efficientlyreducing erase dwell conditions. Step 410 may comprise writing data to afirst storage division 154A-N, as disclosed above. Step 420 comprisesdelaying an erase operation on a second storage division. Step 420 maycomprise selecting the second storage division 154A-N for garbagecollection based on one or more of a primary selection metric, secondaryselection metrics, and/or an alternative selection metric, as disclosedherein. In some embodiments, step 420 comprises selecting the secondstorage division 154A-N based on an amount of invalid data stored withinthe storage division 154A-N. Step 420 may further include preparing thestorage division 154A-N to be erased, which may comprise relocatingvalid data stored on the second storage division 154A-N (if any). Step420 may comprise delaying the erase operation until a threshold numberof the storage units 152 and/or write capacity of the first storagedivision 154A-N have been filled (e.g., T_Filled). Alternatively, step420 may comprise delaying the erase operation until a threshold amountof the write capacity of the first storage division 154A-N has beenconsumed (e.g., T_FillRatio). In another embodiment, step 420 maycomprise delaying the erase operation until a threshold amount of writecapacity remains in the first storage division 154A-N (e.g., T_Remain).The threshold(s) of step 420 may comprise pre-determined valuesapplicable to the storage divisions 154A-N of the storage medium 150.Alternatively, the threshold(s) of step 420 may be calculated inaccordance with profiling metadata 129 pertaining to the first storagedivision 154A-N and/or second storage division 154A-N and/or projectedoperating conditions, such as projected write rate. In anotherembodiment, the delay of step 420 may be configured in accordance with aprojected fill time of the first storage division 154A-N (e.g., ΔT_Fill)and/or erase latency of the second storage division 154A-N (e.g.,ΔT_Erase).

In some embodiments, step 420 comprises delaying the erase operationuntil a write capacity threshold is satisfied. The write capacitythreshold may correspond to available write capacity remaining in thefirst storage division 154A-N and/or write capacity available in one ormore other storage divisions 154A-N (e.g., in a reserve pool). Step 420may comprise initiating the erase operation on the second storagedivision 154A-N in response to the available write capacity on thestorage medium 150 falling below a threshold. In another embodiment,step 420 may comprise delaying the erase operation on the second storagedivision 154A-N until one or more of: a) filling the first storagedivision 154A-N, b) advancing a write pointer 160 and/or append point260 from the first storage division 154A-N (e.g., to a third storagedivision 154A-N), c) writing data to another storage division 154A-N(e.g., writing data to a third storage division 154A-N), and/or thelike.

Step 430 may comprise implementing the erase operation on the secondstorage division 154A-N after the delay period of step 420. The eraseoperation may comprise resetting the second storage division 154A-N intoa writable state, as disclosed herein. Step 430 may further comprisemaking the second storage division 154A-N available for use in servicingstorage requests by, inter alia, placing the second storage division154A-N into a write capacity queue.

FIG. 5 is a flow diagram of one embodiment of a method for managingerase dwell conditions on storage divisions of a storage medium 150.Step 510 comprises writing data at an append point 260 (and/or pointer160) within a current storage division 154A-N. The current storagedivision 154A-N may comprise a storage division comprising writablestorage units 152. In some embodiments, step 510 comprises appendingentries 242 to a storage log 241, as disclosed herein.

Step 520 comprises selecting a storage division 154A-N for a recoveryoperation. Step 520 may comprise selecting the storage division 154A-Nfor use as a next append point. Step 520 may comprise identifying astorage division 154A-N comprising data that does not need to beretained on the storage medium 150 (e.g., invalid data), a storagedivision having low wear relative to other storage divisions 154A-N,and/or the like. Accordingly, step 520 may comprise selecting a storagedivision 154A-N in accordance with a greedy selection algorithm, aninvalid data metric, a granular invalid data metric, an adaptive invaliddata metric, a wear metric, and/or one or more secondary selectionmetrics (e.g., data retention time, wear, and/or the like).

Step 530 comprises initiating a reset operation on the selected storagedivision 154A-N after a delay period. The delay period may correspond tofilling a threshold number of storage units 152 within the currentstorage division 154A-N, filling a threshold ratio of the write capacityof the current storage division 154A-N, and/or determining that athreshold amount of write capacity remains in the current storagedivision 154A-N. Alternatively, or in addition, step 530 may compriseestimating the time the selected storage division will be needed inservicing write requests based on, inter alia, projected fill time forthe current storage division 154A-N, projected erase latency of theselected storage division 154A-N, and/or the like. Step 530 may furtherinclude resetting the selected storage division 154A-N after the delayperiod. Resetting the selected storage division 154A-N may includeerasing, clearing, formatting, and/or reinitializing the selectedstorage division 154A-N to place the selected storage division 154A-Ninto a writable state.

FIG. 6 is a flow diagram of one embodiment of a method for reducingerase block wear due to erase dwell. Step 610 comprises appending datawithin a current erase block at an append point 260 and/or pointer 160.Step 620 may comprise determining a projected fill time of the currenterase block based on, inter alia, write latency of the erase block,projected write rate, and so on. Step 630 may comprise delaying erasureof another erase block based on the projected fill time of step 620.Step 630 may include selecting the erase block for a storage recoveryoperation (e.g., to reclaim the storage capacity of the erase block).Step 630 may further include determining a delay period based on theprojected fill time, projected latency for erasure of the selected eraseblock, and/or the like. Step 630 may further include erasing theselected erase block, placing the erase block into a write capacityqueue, and/or writing data to the erase block, as disclosed herein.

FIG. 7 is a flow diagram of one embodiment of a method for minimizingerase dwell of erase divisions of a storage medium 150. Step 710 maycomprise implementing write operations within a first erase division.Step 710 may comprise servicing storage requests received through astorage interface 111, as disclosed herein. Step 710 may furthercomprise appending data to a storage log 241 at an append point 260and/or writing data at a pointer 160 within the first erase division.

Step 720 may comprise identifying a second erase division for use inservicing write operations, as disclosed herein. Step 730 may comprisescheduling a recovery operation on the second erase division, such thatthe recovery operation is scheduled to complete at the time the seconderase division is needed for write operations. Step 730 may comprisedelaying the recovery operation on the second erase block in accordancewith a projected fill time of the first erase division, a projectederase latency of the second erase division, and/or a projected writerate, as disclosed herein. Step 730 may comprise scheduling the recoveryoperation to begin in response to filling a threshold number of storageunits 152 within the first erase division, filling a threshold ratio ofthe write capacity of the first erase division, falling below aremaining write capacity threshold within the first erase division,and/or the like. Alternatively, step 730 may comprise scheduling therecovery operation to begin in response to an overall write capacityavailable on the storage medium 150 falling below a threshold, advancinga write pointer 160 and/or append point 260 to another erase division,writing data to another erase division, and/or the like. Step 730 mayfurther include recovering the second erase division and/or writing datato writable storage units 152 within the second erase division.

FIG. 8 is a flow diagram of one embodiment of a method 800 for selectingstorage resources for recovery operations. Step 810 may comprisedetermining wear metrics of storage divisions 154A-N of a solid-statestorage medium 150. The wear metrics may quantify the amount of wearincurred on the storage divisions 154A-N. The wear metrics of step 810may be based on one or more of: program and/or write cycle count, readoperation count, erase cycle count, reset cycle count, initializationcycle count, PE cycle count, erase dwell time, error rate, and/or thelike. The wear metrics of step 810 may be derived from monitoringstorage operations performed on the storage medium 150 and/or by use ofprofiling metadata 129, as disclosed herein.

Step 820 comprises determining whether to override a primary selectionmetric with an alternative selection metric. The primary selectionmetric may correspond to one or more of an invalid data metric, agranular invalid data metric, an adaptive invalid data metric, one ormore secondary metrics, and/or the like. Step 820 may be based on wearconditions on the storage medium. In one embodiment, step 820 comprisesdetermining whether differences in wear metrics of the storage divisions154A-N exceed a threshold. Step 820 may comprise determining whether tooverride the primary selection metric in response to a differencebetween the highest PE count (PE_High) and a low PE count (PE_Low)exceeding a difference threshold (T_PECount), such thatPE_High−PE_Low≥T_PECount. In another embodiment, step 820 comprisesdetermining whether to override the primary selection metric based onwhether a difference between a PE count of particular storage divisions154-N and an average PE count of the storage divisions 154A-N (PE_Ave)exceeds a threshold (T_PEAve), such that |PE_Ave−PE_CountB|≥T_PEAve.Alternatively, or in addition, step 820 may comprise modeling adistribution of wear metrics of the storage divisions 154A-N and/oroverriding the primary selection metric in response to a deviation, thevariance of the wear distribution exceeding a threshold, and/or thelike.

Step 820 may further comprise limiting overrides of the primaryselection metric to a particular period and/or frequency (e.g., oneoverride per N selections). Step 820 may, therefore, comprisedetermining whether N selections using the primary selection metric haveoccurred since a last override of the primary selection metric.

Step 830 comprises selecting a storage division 154A-N to recover basedon an alternative selection metric in response to determining tooverride the primary selection metric at step 820. Step 830 may compriseselecting a storage division 154A-N to recover based on wear metrics ofthe storage divisions 154A-N (e.g., select a storage division 154A-Nhaving the lowest amount of wear and/or greatest remaining life), asdisclosed herein.

Step 840 may comprise selecting the storage division 154A-N by use of aprimary selection metric. As disclosed herein, the primary selectionmetric may comprise an invalid data metric, a granular invalid datametric, an adaptive invalid data metric, and/or one or more secondaryselection metrics and/or criteria, as disclosed herein.

Step 850 may comprise resetting the selected storage division 154A-N,which may comprise a) preparing the selected storage division 154A-N tobe reset, and b) resetting the storage units 152 of the selected storagedivision 154A-N to a writable state. Preparing the selected storagedivision 154A-N to be reset may comprise relocating valid data from theselected storage division 154A-N (if any). Resetting the storagedivision 154A-N may comprise scheduling, delaying, deferring and/ortriggering the reset operation to minimize erase dwell time, asdisclosed herein.

FIG. 9 is a flow diagram of one embodiment of a method 900 fordetermining a selection metric for garbage collection operations. Step910 may comprise maintaining metadata pertaining to erase divisions of asolid-state storage medium 150. Step 910 may comprise monitoring storageoperations on the erase divisions recording characteristics of thestorage operation in profiling metadata 129, as disclosed herein. Themetadata of step 910 may include wear metrics, such as program count,write count, PE cycle count, erase dwell time, and so on, as disclosedherein. The metadata 910 may further include validity information toidentify invalid data stored in the erase divisions.

Step 920 may comprise selecting an erase division for garbage collectionbased on a first selection metric. The first selection metric maycorrespond to an amount of invalid data within the erase divisions. Thefirst selection metric may comprise one or more of an invalid datametric, a granular invalid data metric, an adaptive invalid data metric,one or more secondary metrics, and/or the like.

Step 930 may comprise overriding the selection of step 930 with aselection made using a second, different selection metric. The metric ofstep 930 may correspond to wear conditions of the erase divisions. Step930 may comprise determining that wear differences, deviations, and/orvariances between the erase divisions exceed an override threshold. Step930 may comprise replacing the selection of step 920 based on an amountof invalid data within the erase divisions, with an erase divisionselected in accordance with a wear metric. Accordingly, the selection ofstep 930 may be independent of the amount of invalid data within theerase divisions. Step 930 may further comprise implementing a garbagecollection operation on the selected erase division, as disclosedherein.

FIG. 10 is a flow diagram of one embodiment of a method for selecting astorage division to reclaim. Step 1010 may comprise determining one ormore deltas in wear metrics of one or more storage divisions 154A-N of astorage medium 150. Step 1010 may comprise calculating a difference inwear metrics of a high-wear storage division 154A-N and a low-wearstorage division 154A-N. Alternatively, or in addition, step 1010 maycomprise calculating deltas between storage division wear metrics and anaverage wear metric of the storage divisions 154A-N. In anotherembodiment, step 1010 comprises calculating a deviation and/or variancein wear metrics, modeling a distribution of wear metrics, and/or thelike.

Step 1020 comprises determining whether one or more of the wear metricsdeltas of step 1010 exceed a threshold. Step 1020 may comprisedetermining whether to override a primary selection metric and/orcriterion with an alternative selection metric and/or criterion. Step1020 may, therefore, comprise determining whether to select a storagedivision 154A-N for recovery based on an amount of invalid data withinthe storage division 154A-N (e.g., invalid data metric, granular invaliddata metric, adaptive invalid data metric, and/or the like), or aselection metric based on wear metrics of the storage divisions 154A-N.Step 1020 may further include limiting the frequency of overrides to aparticular frequency, as disclosed herein.

Step 1030 comprises selecting a storage division 154A-N to reclaim basedon a wear level metric. Step 1030 may be implemented in response todetermining that the wear level deltas exceed the threshold at step 1020(and/or that the frequency threshold for overrides of the primaryselection metric is satisfied).

Step 1040 comprises selecting a storage division 154A-N to reclaim byuse of the primary selection metric and/or criteria. Step 1040 may beimplemented in response to determining that the wear level deltas do notexceed the threshold at step 1020 (and/or that overriding the primaryselection metric would exceed a pre-determined override limit).

Steps 1030 and/or 1040 may further include reclaiming the selectedstorage division 154A-N, as disclosed herein.

FIG. 11 is a flow diagram of one embodiment of a method 1100 forselecting erase divisions for recovery based on invalid data metrics.Step 1110 may comprise identifying invalid data within erase divisionsof a storage medium 150. The invalid data may be identified by use ofstorage metadata 124, such as the forward map 125 and/or validity map127, disclosed herein.

Step 1120 may comprise determining a granular invalid data metric forthe respective erase divisions, as disclosed herein. Step 1120 maycomprise quantizing the amount of invalid data in the erase divisionsinto a discrete set of granules (e.g., recovery blocks). Step 1120 may,therefore, comprise calculating an invalid data metric in terms ofrecovery block size. The recovery blocks may represent a storagecapacity that is larger than the physical storage capacity of thestorage units 152 of the erase divisions.

Step 1130 may comprise selecting an erase division to recover based onan adaptive comparison of the granular invalid data metrics of step1120. As disclosed herein, an adaptive comparison and/or selectioncriterion refers to a comparison that is a function of the relativeamounts of invalid data within the storage divisions. Step 1130 maycomprise adjusting the resolution and/or weight of differences ininvalid data metrics in accordance with the relative amount of invaliddata within the erase divisions. In one embodiment, the adaptivecomparison is configured to reduce the weight of differences in theinvalid data metrics when comparing erase divisions comprisingrelatively large amounts of invalid data (since small differences in theoverall amount of invalid data are unlikely to significantly affectwrite amplification). By contrast, differences in the invalid datametrics in comparisons between erase divisions comprising smalleramounts of invalid data may be weighted more heavily (since recovery ofsuch storage divisions is likely to create significantly more writeamplification). The adaptive comparison of step 1130 may comprise alogarithmic comparison of the invalid data metrics of the storagedivisions (e.g., the approximate base 2 log of the raw and/or granularinvalid data metrics of the erase divisions) and/or may comprisederiving adaptive invalid data metrics corresponding to the erasedivisions. Erase divisions having similar adaptive invalid data metrics(and/or within a threshold) may be distinguished by use of a secondaryselection metric, as disclosed herein (e.g., based on wear metric, dataretention time, and/or the like). Step 1130 may further includerecovering the selected erase division as disclosed herein.

The modules, components, layers, and/or facilities disclosed herein,including, but not limited to: the storage layer 110, storage manager112, media controller 116, translation module 120, media manager 130,garbage collector 132, selector module 134, erase manager 136, logstorage module 150, and so on, may be implemented in software, hardware,and/or a combination of software and hardware elements. In someembodiments, portions of the disclosed modules, components, and/orfacilities are embodied as executable instructions stored on anon-transitory, machine-readable storage medium. The instructions maycomprise computer program code that, when executed by a computingdevice, cause the computing device to implement certain processingsteps, procedures, and/or operations, as disclosed herein. The modules,components, and/or facilities disclosed herein may be implemented and/orembodied as a driver, a library, an interface, an API, FPGAconfiguration data, firmware (e.g., stored on an EEPROM), and/or thelike. In some embodiments, portions of the modules, components, and/orfacilities disclosed herein are embodied as machine components, such asgeneral and/or application-specific devices, including, but not limitedto: circuits, integrated circuits, processing components, interfacecomponents, hardware controller(s), storage controller(s), programmablehardware, FPGAs, ASICs, and/or the like. Accordingly, the modulesdisclosed herein may be referred to as controllers, layers, services,engines, facilities, drivers, circuits, and/or the like.

This disclosure has been made with reference to various exemplaryembodiments. However, those skilled in the art will recognize thatchanges and modifications may be made to the exemplary embodimentswithout departing from the scope of the present disclosure. For example,various operational steps, as well as components for carrying outoperational steps, may be implemented in alternative ways depending uponthe particular application or in consideration of any number of costfunctions associated with the operation of the system (e.g., one or moreof the steps may be deleted, modified, or combined with other steps).Therefore, this disclosure is to be regarded in an illustrative ratherthan a restrictive sense, and all such modifications are intended to beincluded within the scope thereof. Likewise, benefits, other advantages,and solutions to problems have been described above with regard tovarious embodiments. As used herein, the terms “comprises,”“comprising,” and any other variation thereof are intended to cover anon-exclusive inclusion, such that a process, a method, an article, oran apparatus that comprises a list of elements does not include onlythose elements but may include other elements not expressly listed orinherent to such process, method, system, article, or apparatus. Also,as used herein, the terms “coupled,” “coupling,” and any other variationthereof are intended to cover a physical connection, an electricalconnection, a magnetic connection, an optical connection, acommunicative connection, a functional connection, and/or any otherconnection.

Additionally, as will be appreciated by one of ordinary skill in theart, principles of the present disclosure may be reflected in a computerprogram product on a machine-readable storage medium havingmachine-readable program code means embodied in the storage medium. Anytangible, non-transitory machine-readable storage medium may beutilized, including magnetic storage devices (hard disks, floppy disks,and the like), optical storage devices (CD-ROMs, DVDs, Blu-ray discs,and the like), flash memory, and/or the like. These computer programinstructions may be loaded onto a general purpose computer, specialpurpose computer, or other programmable data processing apparatus toproduce a machine, such that the instructions that execute on thecomputer or other programmable data processing apparatus create meansfor implementing the functions specified. These computer programinstructions may also be stored in a machine-readable memory that candirect a computer or other programmable data processing apparatus tofunction in a particular manner, such that the instructions stored inthe machine-readable memory produce an article of manufacture, includingimplementing means that implement the function specified. The computerprogram instructions may also be loaded onto a computer or otherprogrammable data processing apparatus to cause a series of operationalsteps to be performed on the computer or other programmable apparatus toproduce a computer-implemented process, such that the instructions thatexecute on the computer or other programmable apparatus provide stepsfor implementing the functions specified.

While the principles of this disclosure have been shown in variousembodiments, many modifications of structure, arrangements, proportions,elements, materials, and components that are particularly adapted for aspecific environment and operating requirements may be used withoutdeparting from the principles and scope of this disclosure. These andother changes or modifications are intended to be included within thescope of the disclosure.

I claim:
 1. An apparatus, comprising: a storage manager configured towrite data to a first storage division of a solid-state storage medium;and an erase manager configured to perform erase operations on a secondstorage division of the solid-state storage medium, each erase operationto reset a respective portion of the second storage division from anunwriteable state to a writeable state, wherein the erase manager isconfigured to maintain a first portion of the second storage division inthe unwriteable state until data have been written to a threshold amountof a storage capacity of the first storage division.
 2. The apparatus ofclaim 1, wherein the erase manager is configured to perform a firsterase operation to reset the first portion of the second storagedivision from the unwriteable state to the writeable state in responseto the storage manager writing data to the threshold amount of thestorage capacity of the first storage division.
 3. The apparatus ofclaim 2, wherein the erase manager is configured to maintain a secondportion of the second storage division in the unwriteable state inresponse to performing the first erase operation on the first portion ofthe second storage division.
 4. The apparatus of claim 3, wherein theerase manager is configured to maintain the second portion of the secondstorage division in the unwriteable state until data are written to apredetermined amount of a storage capacity of the first portion of thesecond storage division.
 5. The apparatus of claim 3, wherein the erasemanager is configured to initiate a second erase operation to reset thesecond portion of the second storage division to the writeable state inresponse to filling a predetermined amount of a storage capacity of thefirst portion of the second storage division.
 6. The apparatus of claim5, wherein a determined amount is based on one or more of: a projectedfill time of the first portion of the second storage division and aprojected latency of the second erase operation.
 7. The apparatus ofclaim 6, wherein the erase manager determines the projected fill time ofthe first portion of the second storage division based on one or more ofa wear level of the second storage division, measured program latency ofthe second storage division, measured program latency of a plurality ofstorage divisions of the solid-state storage medium, and a projectedrate of write operations on the second storage division.
 8. Theapparatus of claim 6, wherein the erase manager determines a protectedlatency of the second erase operation based on one or more of a wearlevel of the second storage division and a latency of one or moreprevious erase operations performed on the second storage division. 9.The apparatus of claim 1, further comprising a storage division selectorconfigured to select the second storage division for recovery, whereinthe erase manager is configured to delay the erase operations on thesecond storage division in response to selection of the second storagedivision for recovery by the storage division selector.
 10. Theapparatus of claim 1, further comprising a garbage collector configuredto prepare the first portion of the second storage division for a firsterase operation by relocating valid data stored on the first portion ofthe second storage division to one or more other storage divisions ofthe solid-state storage medium.
 11. A system, comprising: a storagedevice comprising a non-volatile storage medium having a plurality oferase blocks, the storage device configured to append data to a storagelog on the non-volatile storage medium at an append point within acurrent erase block of the plurality of erase blocks; and a mediamanager configured to prepare erase blocks for use as append points ofthe storage log, wherein, to prepare a particular erase block for use asa next append point of the storage log, the media manager is configuredto: delay erase operations on the particular erase block, such that theparticular erase block is maintained in an un-erased state until dataare appended to a threshold number of pages of the current erase block,and perform a first erase operation to erase a first portion of theparticular erase block in response to data being appended to thethreshold number of pages of the current erase block, wherein a secondportion of the particular erase block remains in the un-erased state inresponse to performing the first erase operation.
 12. The system ofclaim 11, wherein the media manager is further configured to determinethe threshold number of pages based on one or more of a wear level ofthe particular erase block and a latency of one or more previous eraseoperations performed on the particular erase block.
 13. The system ofclaim 11, wherein the media manager is further configured to hold thesecond portion of the particular erase block in the un-erased statewhile data are appended to pages of the first portion of the particularerase block.
 14. The system of claim 11, wherein the media manager isfurther configured to perform a second erase operation to erase thesecond portion of the particular erase block in response to appendingdata to one or more pages of the first portion of the particular eraseblock.
 15. The system of claim 11, wherein the media manager is furtherconfigured to delay erasing the second portion of the particular eraseblock for a delay period, the delay period based on one or more of: anestimated fill time of the first portion of the particular erase blockand an estimated erase latency for the second portion of the particularerase block.
 16. The system of claim 15, wherein the estimated fill timeis based on one or more of: wear level of the particular erase block,measured program latency of the particular erase block, measured programlatency of a plurality of erase blocks of the solid-state storagemedium, and a rate of write requests received at the storage device. 17.The system of claim 15, wherein the estimated erase latency for thesecond portion of the particular erase block is based on a number ofprogram erase cycles performed on the particular erase block and alatency of one or more previous erase operations performed on theparticular erase block.
 18. A method, comprising: programming data toerased storage locations within respective erase divisions of asolid-state storage medium; and erasing selected erase divisions of thesolid-state storage medium, wherein erasing a selected erase divisioncomprising a plurality of storage locations comprises: leaving storagelocations of the selected erase division in a non-erased state until awrite capacity threshold is satisfied, the write capacity thresholdcorresponding to a storage capacity of erased storage locations of thesolid-state storage medium, and reinitializing a first subset of thestorage locations of the selected erase division to an erased state inresponse to determining that the write capacity threshold is satisfied,wherein a second subset of the storage locations remain in thenon-erased state in response to reinitializing the storage locations ofthe first subset.
 19. The method of claim 18, wherein satisfying thewrite capacity threshold comprises determining that that solid-statestorage medium comprises fewer than a threshold number of erased storagelocations.
 20. The method of claim 19, wherein reinitializing the firstsubset of the storage locations of the selected erase division comprisesincreasing a number of erased storage locations available on thesolid-state storage medium, the method further comprising:reinitializing the second subset of the storage locations of theselected erase division in response to the number of erased storagelocations available on the solid-state storage medium falling below thethreshold number.